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- catalog contributor b10314542.
- catalog contributor b10314543.
- catalog created "c1983.".
- catalog date "1983".
- catalog date "c1983.".
- catalog dateCopyrighted "c1983.".
- catalog description "Includes bibliographies and index.".
- catalog extent "vi, 207 p. :".
- catalog hasFormat "Precision surface metrology.".
- catalog identifier "0892524642 (pbk.)".
- catalog isFormatOf "Precision surface metrology.".
- catalog isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 429".
- catalog issued "1983".
- catalog issued "c1983.".
- catalog language "eng".
- catalog publisher "Bellingham, Wash., USA : SPIE--the International Society for Optical Engineering,".
- catalog relation "Precision surface metrology.".
- catalog subject "681/.4 19".
- catalog subject "Glass Surfaces Measurement Congresses.".
- catalog subject "Interferometry Congresses.".
- catalog subject "Optical measurements Congresses.".
- catalog subject "QC375 .P74 1983".
- catalog title "Precision surface metrology : August 23-24, 1983, San Diego, California / James C. Wyant, chairman/editor.".
- catalog type "text".