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- catalog contributor b10335377.
- catalog contributor b10335378.
- catalog contributor b10335379.
- catalog contributor b10335380.
- catalog created "c1997.".
- catalog date "1997".
- catalog date "c1997.".
- catalog dateCopyrighted "c1997.".
- catalog description "Includes bibliographical references and index.".
- catalog description "Radioactive Isotopes in Photoluminescence Experiments: Identification of Defect Levels / R. Magerle -- True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopy / Y. Sugawara, H. Ueyama and T. Uchihashi [and others] -- Optical NMR from Single Quantum Dots / S.W. Brown, T.A. Kennedy and D. Gammon -- Low-Temperature Infrared Absorption Measurement for Oxygen Concentration and Precipitates in Heavily-Doped Silicon Wafers / M. Koizuka, M. Inaba and H. Yamada-Kaneta -- A New Measurement Method of Microdefects Near the Surface of Si Wafers; Optical Shallow Defect Analyzer (OSDA) / Kazuo Takeda, Hidetsugu Ishida and Atsushi Hiraiwa.".
- catalog extent "711 p. :".
- catalog hasFormat "Defects in electronic materials II.".
- catalog identifier "1558993460".
- catalog isFormatOf "Defects in electronic materials II.".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 442.".
- catalog isPartOf "Materials Research Society symposium proceedings, 0272-9172 ; v. 442".
- catalog issued "1997".
- catalog issued "c1997.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Penn : Materials Research Society,".
- catalog relation "Defects in electronic materials II.".
- catalog subject "621.3815/2 21".
- catalog subject "Electronics Materials Defects Congresses.".
- catalog subject "Semiconductors Defects Congresses.".
- catalog subject "TK7871 .D4 1997".
- catalog tableOfContents "Radioactive Isotopes in Photoluminescence Experiments: Identification of Defect Levels / R. Magerle -- True Atomic Resolution Imaging on Semiconductor Surfaces with Noncontact Atomic Force Microscopy / Y. Sugawara, H. Ueyama and T. Uchihashi [and others] -- Optical NMR from Single Quantum Dots / S.W. Brown, T.A. Kennedy and D. Gammon -- Low-Temperature Infrared Absorption Measurement for Oxygen Concentration and Precipitates in Heavily-Doped Silicon Wafers / M. Koizuka, M. Inaba and H. Yamada-Kaneta -- A New Measurement Method of Microdefects Near the Surface of Si Wafers; Optical Shallow Defect Analyzer (OSDA) / Kazuo Takeda, Hidetsugu Ishida and Atsushi Hiraiwa.".
- catalog title "Defects in electronic materials II : synposium held December 2-6, 1996, Boston, Massachusetts, U.S.A. / editors, Jurgen Michel ... [et al.].".
- catalog type "Boston (Mass., 1996) swd".
- catalog type "Conference proceedings. fast".
- catalog type "text".