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- catalog contributor b10400712.
- catalog created "c1997.".
- catalog date "1997".
- catalog date "c1997.".
- catalog dateCopyrighted "c1997.".
- catalog description "Ch. 1. Introduction / John C. Vickerman -- Ch. 2. Vacuum Technology for Applied Surface Science / Rod Wilson -- Ch. 3. Electron Spectroscopy for Chemical Analysis / Buddy Ratner and David Castner -- Ch. 4. Auger Electron Spectroscopy / Hans Jorg and Mathieu -- Ch. 5. Secondary Ion Mass Spectrometry -- the Surface Mass Spectrometry / John C. Vickerman and Andrew Swift -- Ch. 6. Low-energy Ion Scattering and Rutherford Backscattering / Edmund Taglauer -- Ch. 7. Vibrational Spectroscopy from Surfaces / Martyn Pemble -- Ch. 8. Surface Structure Determination by Interference Techniques / Wendy R. Flavell -- Ch. 9. Scanning Tunnelling Microscopy and Atomic Force Microscopy / Graham Leggett.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xvi, 457 p. :".
- catalog hasFormat "Surface analysis.".
- catalog identifier "0471959391 (cloth : alk. paper)".
- catalog identifier "0471972924 (paper)".
- catalog isFormatOf "Surface analysis.".
- catalog issued "1997".
- catalog issued "c1997.".
- catalog language "eng".
- catalog publisher "Chichester ; New York : John Wiley,".
- catalog relation "Surface analysis.".
- catalog subject "620/.44 21".
- catalog subject "Spectrum analysis.".
- catalog subject "Surfaces (Technology) Analysis.".
- catalog subject "TA418.7 .P75 1997".
- catalog tableOfContents "Ch. 1. Introduction / John C. Vickerman -- Ch. 2. Vacuum Technology for Applied Surface Science / Rod Wilson -- Ch. 3. Electron Spectroscopy for Chemical Analysis / Buddy Ratner and David Castner -- Ch. 4. Auger Electron Spectroscopy / Hans Jorg and Mathieu -- Ch. 5. Secondary Ion Mass Spectrometry -- the Surface Mass Spectrometry / John C. Vickerman and Andrew Swift -- Ch. 6. Low-energy Ion Scattering and Rutherford Backscattering / Edmund Taglauer -- Ch. 7. Vibrational Spectroscopy from Surfaces / Martyn Pemble -- Ch. 8. Surface Structure Determination by Interference Techniques / Wendy R. Flavell -- Ch. 9. Scanning Tunnelling Microscopy and Atomic Force Microscopy / Graham Leggett.".
- catalog title "Surface analysis-- the principle techniques / edited by John C. Vickerman.".
- catalog type "Aufsatzsammlung. swd".
- catalog type "text".