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- catalog contributor b10508931.
- catalog created "c1997.".
- catalog date "1997".
- catalog date "c1997.".
- catalog dateCopyrighted "c1997.".
- catalog description "Determination of Atomic Structure at Surfaces and Interfaces by High-Resolution STEM / S.J. Pennycook, P.D. Nellist and M.F. Chisholm [and others] -- Determination of the Three-Dimensional Atomic Structure at Internal Interfaces by Electron Energy Loss Spectroscopy / N.D. Browning, D.J. Wallis and S.J. Pennycook -- The Effect of Strain Relaxation Mechanisms on the Electrical Properties of Epitaxial CaF[subscript 2]/Si(111) Heterostructures / L.J. Schowalter, B.M. Kim and T.G. Thundat [et al.] -- Grain Boundaries in Diamond Films on Si(001) / D. Wittorf, C.L. Jia and W. Jager [et al.] -- Metal-ZnO Interfaces Studied by High-Resolution Transmission Electron Microscopy / J. Th. M. De Hosson, W.P. Vellinga and H.B. Groen [et al.].".
- catalog description "Includes bibliographical references and indexes.".
- catalog extent "ix, 282 p. :".
- catalog hasFormat "Atomic resolution microscopy of surfaces and interfaces.".
- catalog identifier "1558993703".
- catalog isFormatOf "Atomic resolution microscopy of surfaces and interfaces.".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 466.".
- catalog isPartOf "Materials Research Society symposium proceedings, 0272-9172 ; v. 466".
- catalog issued "1997".
- catalog issued "c1997.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Pa. : Materials Research Society,".
- catalog relation "Atomic resolution microscopy of surfaces and interfaces.".
- catalog subject "620.1/1299 21".
- catalog subject "Atom-probe field ion microscopy Congresses.".
- catalog subject "Materials Microscopy Congresses.".
- catalog subject "TA417.23 .A86 1997".
- catalog tableOfContents "Determination of Atomic Structure at Surfaces and Interfaces by High-Resolution STEM / S.J. Pennycook, P.D. Nellist and M.F. Chisholm [and others] -- Determination of the Three-Dimensional Atomic Structure at Internal Interfaces by Electron Energy Loss Spectroscopy / N.D. Browning, D.J. Wallis and S.J. Pennycook -- The Effect of Strain Relaxation Mechanisms on the Electrical Properties of Epitaxial CaF[subscript 2]/Si(111) Heterostructures / L.J. Schowalter, B.M. Kim and T.G. Thundat [et al.] -- Grain Boundaries in Diamond Films on Si(001) / D. Wittorf, C.L. Jia and W. Jager [et al.] -- Metal-ZnO Interfaces Studied by High-Resolution Transmission Electron Microscopy / J. Th. M. De Hosson, W.P. Vellinga and H.B. Groen [et al.].".
- catalog title "Atomic resolution microscopy of surfaces and interfaces : symposium held December 3-5, 1996, Boston, Massachusetts, U.S.A. / editor, David J. Smith.".
- catalog type "Boston (Mass., 1996) swd".
- catalog type "Conference proceedings. fast".
- catalog type "text".