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- catalog abstract "This book provides an overview of the most current techniques used for chemical analysis, materials evaluation, and materials testing. Over 100 materials methodologies, evaluations, chemical analyses, physical testing, and scientific computing techniques are covered, including the fields of molecular spectroscopy, mass spectroscopy, chromatography, chemical analysis, x-ray analysis, microscopy, surface science, thermal analysis, and polymer characterization. All of the. Techniques are explained in a clear, easy-to-read format and are discussed in terms of their use, sample requirements, and the underlying chemical, physical, and engineering principles. Many real-life industrial and academic applications are included to give the reader a true feel for the significance and uses of each technique, enabling him or her to identify the best approach for solving a particular problem. For each technique, a section is included that describes its. Advantages and limitations, along with general references for further reading. A Guide to Materials Characterization and Chemical Analysis, Second Edition, will be of interest to analytical, inorganic, organic, and physical chemists; physicists; materials scientists; chemical engineers; and instructors and students in materials science and instrumental analysis.".
- catalog contributor b10543628.
- catalog created "c1996.".
- catalog date "1996".
- catalog date "c1996.".
- catalog dateCopyrighted "c1996.".
- catalog description "Advantages and limitations, along with general references for further reading. A Guide to Materials Characterization and Chemical Analysis, Second Edition, will be of interest to analytical, inorganic, organic, and physical chemists; physicists; materials scientists; chemical engineers; and instructors and students in materials science and instrumental analysis.".
- catalog description "An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry / R. Donald Sedgewick and David M. Hindenlang -- Separation techniques / Mina K. Gabriel [and others] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy / John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers / Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation / Willis B. Hammond and Jon M. Peltier.".
- catalog description "Includes bibliographical references and index.".
- catalog description "Techniques are explained in a clear, easy-to-read format and are discussed in terms of their use, sample requirements, and the underlying chemical, physical, and engineering principles. Many real-life industrial and academic applications are included to give the reader a true feel for the significance and uses of each technique, enabling him or her to identify the best approach for solving a particular problem. For each technique, a section is included that describes its.".
- catalog description "This book provides an overview of the most current techniques used for chemical analysis, materials evaluation, and materials testing. Over 100 materials methodologies, evaluations, chemical analyses, physical testing, and scientific computing techniques are covered, including the fields of molecular spectroscopy, mass spectroscopy, chromatography, chemical analysis, x-ray analysis, microscopy, surface science, thermal analysis, and polymer characterization. All of the.".
- catalog extent "xii, 388 p. :".
- catalog hasFormat "Guide to materials characterization and chemical analysis.".
- catalog identifier "1560819227 (acid-free paper)".
- catalog isFormatOf "Guide to materials characterization and chemical analysis.".
- catalog issued "1996".
- catalog issued "c1996.".
- catalog language "eng".
- catalog publisher "New York : VCH,".
- catalog relation "Guide to materials characterization and chemical analysis.".
- catalog subject "543 20".
- catalog subject "Chemistry, Analytic.".
- catalog subject "Materials Testing.".
- catalog subject "QD75.2 .G83 1996".
- catalog tableOfContents "An introduction to materials characterization and chemical analysis / John P. Sibilia -- Molecular spectroscopy / Robert G. Bray and John P. Sibilia -- Magnetic resonance spectroscpy / Sean A. Curran and Raymond Brambilla -- Mass spectrometry / R. Donald Sedgewick and David M. Hindenlang -- Separation techniques / Mina K. Gabriel [and others] -- Elemental and chemical analysis / Richard J. Williams and Daniel E. Bause -- X-ray analysis / N. Sanjeeva Murthy and Franz Reidinger -- Microscopy / John E. Macur, Jordi Marti, and Siu-Ching Lui -- Image analysis / Siu-Ching Lui -- Surface analysis / Edgar A. Leone and Anthony J. Signorelli -- Thermal characterization of materials / Yash P. Khanna -- Rheology and molecular weight of polymers / Yash P. Khanna, Milton E. McDonnell and Peter K. Han -- Physical properties of particles and polymers / Milton E. McDonnell and Karl Zero -- Applied mechanics and physical testing / Igor Palley and Nanying Jia -- Scientific computation / Willis B. Hammond and Jon M. Peltier.".
- catalog title "A guide to materials charaterization and chemical analysis / edited by John P. Sibilia.".
- catalog type "text".