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- catalog contributor b10563706.
- catalog contributor b10563707.
- catalog created "c1990.".
- catalog date "1990".
- catalog date "c1990.".
- catalog dateCopyrighted "c1990.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "vi, 196 p. :".
- catalog hasFormat "Tests, measurements, and characterization of electro-optic devices and systems.".
- catalog identifier "0819402168".
- catalog isFormatOf "Tests, measurements, and characterization of electro-optic devices and systems.".
- catalog isPartOf "Proceedings / SPIE--the International Society for Optical Engineering ; v. 1180".
- catalog isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 1180.".
- catalog issued "1990".
- catalog issued "c1990.".
- catalog language "eng".
- catalog publisher "Bellingham, Wash. : SPIE,".
- catalog relation "Tests, measurements, and characterization of electro-optic devices and systems.".
- catalog subject "Electrooptical devices Congresses.".
- catalog subject "Electrooptics Congresses.".
- catalog subject "TA1750 .T477 1990".
- catalog title "Tests, measurements, and characterization of electro-optic devices and systems : 8 September 1989, Boston, Massachusetts / Shekhar G. Wadekar, chair/editor.".
- catalog type "Conference proceedings. fast".
- catalog type "text".