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- catalog contributor b10563721.
- catalog contributor b10563722.
- catalog created "c1995.".
- catalog date "1995".
- catalog date "c1995.".
- catalog dateCopyrighted "c1995.".
- catalog description "Growth and characterization of materials for infrared detectors II: Detector materials growth ; Detector materials characterization ; Detector processing -- Optical materials characterization techniques: Optical materials characterization techniques.".
- catalog description "Includes bibliographic references and author index.".
- catalog extent "vii, 296 p. :".
- catalog hasFormat "Growth and characterization of materials for infrared detectors II.".
- catalog identifier "0819419133".
- catalog isFormatOf "Growth and characterization of materials for infrared detectors II.".
- catalog isPartOf "Proceedings / SPIE--the International Society for Optical Engineering ; v. 2554".
- catalog isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 2554.".
- catalog issued "1995".
- catalog issued "c1995.".
- catalog language "eng".
- catalog publisher "Bellingham, Wash. : SPIE,".
- catalog relation "Growth and characterization of materials for infrared detectors II.".
- catalog subject "621.36/2 21".
- catalog subject "Infrared detectors Materials Congresses.".
- catalog subject "Infrared technology Congresses.".
- catalog subject "Molecular beam epitaxy Congresses.".
- catalog subject "Nondestructive testing Congresses.".
- catalog subject "Optical materials Analysis Congresses.".
- catalog subject "TA1570 .G74 1995".
- catalog tableOfContents "Growth and characterization of materials for infrared detectors II: Detector materials growth ; Detector materials characterization ; Detector processing -- Optical materials characterization techniques: Optical materials characterization techniques.".
- catalog title "Growth and characterization of materials for infrared detectors II : 13-14 July, 1995, San Diego, California / Randolph E. Longshore ... [et al.], chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- catalog type "text".