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- catalog alternative "Antireflecting chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems".
- catalog contributor b10580640.
- catalog contributor b10580641.
- catalog created "1997.".
- catalog date "1997".
- catalog date "1997.".
- catalog dateCopyrighted "1997.".
- catalog description "Includes bibliographical references (p. 17-18).".
- catalog extent "xiii, 23 p. :".
- catalog isPartOf "NIST special publication ; 260-129".
- catalog isPartOf "Standard reference materials".
- catalog issued "1997".
- catalog issued "1997.".
- catalog language "eng".
- catalog publisher "Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington : For sale by the Supt. of Docs., U.S. G.P.O.,".
- catalog subject "Chromium Spectra Standards.".
- catalog subject "Integrated circuits Masks Measurement.".
- catalog subject "Microscopes Calibration Standards.".
- catalog title "Antireflecting chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems".
- catalog title "Antireflecting-chromium linewidth standard, SRM 473, for calibration of optical microscope linewidth measuring systems [microform] / James E. Potzick.".
- catalog type "text".