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- catalog contributor b10747338.
- catalog contributor b10747339.
- catalog contributor b10747340.
- catalog created "c1995.".
- catalog date "1995".
- catalog date "c1995.".
- catalog dateCopyrighted "c1995.".
- catalog description "Includes bibliographic references and author index.".
- catalog description "Specifying, measuring, and analyzing spatial frequency errors -- Testing precision optics -- Asphere testing I : interferometric -- Asphere testing II : geometric ray and profilers -- Optical manufacturing -- Deterministic microgrinding and tool development -- Computer controlled figuring -- Polishing of low-scatter surfaces -- Fabricating and testing large optical systems -- Fabricating glass mirror substrates -- Fabricating and testing micro- and hybrid-optical systems -- Testing MTF and physical parameters.".
- catalog extent "xii, 516 p. :".
- catalog hasFormat "Optical manufacturing and testing.".
- catalog identifier "0819418951".
- catalog isFormatOf "Optical manufacturing and testing.".
- catalog isPartOf "Proceedings / SPIE--the International Society for OPtical Engineering ; v. 2536".
- catalog isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 2536.".
- catalog issued "1995".
- catalog issued "c1995.".
- catalog language "eng".
- catalog publisher "Bellingham, Wash. : SPIE,".
- catalog relation "Optical manufacturing and testing.".
- catalog subject "681/.4 21".
- catalog subject "Optical engineering Congresses.".
- catalog subject "Optical instruments Design and construction Congresses.".
- catalog subject "Optical instruments Testing Congresses.".
- catalog subject "Optical materials Congresses.".
- catalog subject "TS510 .O588 1995".
- catalog tableOfContents "Specifying, measuring, and analyzing spatial frequency errors -- Testing precision optics -- Asphere testing I : interferometric -- Asphere testing II : geometric ray and profilers -- Optical manufacturing -- Deterministic microgrinding and tool development -- Computer controlled figuring -- Polishing of low-scatter surfaces -- Fabricating and testing large optical systems -- Fabricating glass mirror substrates -- Fabricating and testing micro- and hybrid-optical systems -- Testing MTF and physical parameters.".
- catalog title "Optical manufacturing and testing : 9-11 July, 1995, San Diego, California / Victor J, Doherty, H. Philip Stahl, chairs/editors ; sponsored and published by SPIE--the International Society for Optical Engineering.".
- catalog type "Conference proceedings. fast".
- catalog type "text".