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- catalog alternative "Certification of one hundred mm diameter silicon resistivity SRMs ...".
- catalog contributor b10779705.
- catalog contributor b10779706.
- catalog contributor b10779707.
- catalog created "1997.".
- catalog date "1997".
- catalog date "1997.".
- catalog dateCopyrighted "1997.".
- catalog description "Includes bibliographical references.".
- catalog extent "xv, 84 p. :".
- catalog isPartOf "NIST special publication ; 260-131".
- catalog isPartOf "Standard reference materials".
- catalog issued "1997".
- catalog issued "1997.".
- catalog language "eng".
- catalog publisher "Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,".
- catalog subject "Silicon Electric properties.".
- catalog subject "Silicon.".
- catalog title "Certification of one hundred mm diameter silicon resistivity SRMs ...".
- catalog title "The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin.".
- catalog type "text".