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- catalog abstract "Integrated Circuit Manufacturability provides comprehensive coverage of the process and design variables that determine the ease and feasibility of the fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage.".
- catalog contributor b10969961.
- catalog contributor b10969962.
- catalog contributor b10969963.
- catalog created "c1999.".
- catalog date "1999".
- catalog date "c1999.".
- catalog dateCopyrighted "c1999.".
- catalog description "Ch. 1. Introduction / Jose Pineda de Gyvez -- Ch. 2. Defect Monitoring and Characterization / Eric Bruis -- Ch. 3. Digital CMOS Fault Modeling and Inductive Fault Analysis / Manoj Sachdev -- Ch. 4. Functional Yield Modeling / Gary C. Cheek and Geoff O'Donoghue -- Ch. 5. Critical Area and Fault Probability Prediction / D.M.H. Walker -- Ch. 6. Statistical Methods of Parametric Yield and Quality Enhancement / Maciej Styblinski -- Ch. 7. Architectural Fault Tolerance / S.K. Tewksbury -- Ch. 8. Design for Test and Manufacturability / Dhiraj Pradhan and Adit Singh -- Ch. 9. Testing Solutions for MCM Manufacturing / Yervant Zorian.".
- catalog description "Includes bibliographical references and index.".
- catalog description "Integrated Circuit Manufacturability provides comprehensive coverage of the process and design variables that determine the ease and feasibility of the fabrication (or manufacturability) of contemporary VLSI systems and circuits. This book progresses from semiconductor processing to electrical design to system architecture. The material provides a theoretical background as well as case studies, examining the entire design for the manufacturing path from circuit to silicon. Each chapter includes tutorial and practical applications coverage.".
- catalog extent "xv, 316 p. :".
- catalog identifier "0780334477 (alk. paper)".
- catalog issued "1999".
- catalog issued "c1999.".
- catalog language "eng".
- catalog publisher "Piscataway, NJ : IEEE Press ; New York : Institute of Electrical and Electronics Engineers,".
- catalog subject "621.3815 21".
- catalog subject "Computer-aided design.".
- catalog subject "Integrated circuits Computer-aided design.".
- catalog subject "Integrated circuits Design and construction Data processing.".
- catalog subject "Integrated circuits Testing.".
- catalog subject "Metal oxide semiconductors, Complementary Computer-aided design.".
- catalog subject "Metal oxide semiconductors, Complementary Design and construction Data processing.".
- catalog subject "TK7874 .I4713 1999".
- catalog tableOfContents "Ch. 1. Introduction / Jose Pineda de Gyvez -- Ch. 2. Defect Monitoring and Characterization / Eric Bruis -- Ch. 3. Digital CMOS Fault Modeling and Inductive Fault Analysis / Manoj Sachdev -- Ch. 4. Functional Yield Modeling / Gary C. Cheek and Geoff O'Donoghue -- Ch. 5. Critical Area and Fault Probability Prediction / D.M.H. Walker -- Ch. 6. Statistical Methods of Parametric Yield and Quality Enhancement / Maciej Styblinski -- Ch. 7. Architectural Fault Tolerance / S.K. Tewksbury -- Ch. 8. Design for Test and Manufacturability / Dhiraj Pradhan and Adit Singh -- Ch. 9. Testing Solutions for MCM Manufacturing / Yervant Zorian.".
- catalog title "Integrated circuit manufacturability : the art of process and design integration / edited by José Pineda de Gyvez, Dhiraj Pradhan.".
- catalog type "text".