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- catalog contributor b11007509.
- catalog contributor b11007510.
- catalog created "c1998.".
- catalog date "1998".
- catalog date "c1998.".
- catalog dateCopyrighted "c1998.".
- catalog description "Includes bibliographical references and index.".
- catalog description "The Dynamics of Frequency-Specific, Depth-Sensing Indentation Testing / B.N. Lucas, W.C. Oliver and J.E. Swindeman -- Evaluation of the Effective Radius of Spherical Indenters for Ultra-Microindentation / T.J. Bell, J.S. Field and F.J. Lesha [and others] -- Evolution of Contact Area and Pile-Up During the Nanoindentation of Soft Coatings on Hard Substrates / N.X. Randall and C. Julia-Schmutz -- The Importance of Contact Radius for Substrate-Independent Property Measurement of Thin Films / J.L. Hay, M.E. O'Hern and W.C. Oliver -- Pile-Up Behavior of Spherical Indentations in Engineering Materials / B. Taljat, T. Zacharia and G.M. Pharr.".
- catalog extent "xiii, 491 p. :".
- catalog identifier "1558994289".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 522.".
- catalog isPartOf "Materials Research Society symposium proceedings ; v. 522".
- catalog issued "1998".
- catalog issued "c1998.".
- catalog language "eng".
- catalog publisher "Warrendale, Penn. : Materials Research Society,".
- catalog subject "620/.44 21".
- catalog subject "Nanotechnology Congresses.".
- catalog subject "Surfaces (Technology) Testing Congresses.".
- catalog subject "TA418.7 .F86 1998".
- catalog subject "Tribology Congresses.".
- catalog tableOfContents "The Dynamics of Frequency-Specific, Depth-Sensing Indentation Testing / B.N. Lucas, W.C. Oliver and J.E. Swindeman -- Evaluation of the Effective Radius of Spherical Indenters for Ultra-Microindentation / T.J. Bell, J.S. Field and F.J. Lesha [and others] -- Evolution of Contact Area and Pile-Up During the Nanoindentation of Soft Coatings on Hard Substrates / N.X. Randall and C. Julia-Schmutz -- The Importance of Contact Radius for Substrate-Independent Property Measurement of Thin Films / J.L. Hay, M.E. O'Hern and W.C. Oliver -- Pile-Up Behavior of Spherical Indentations in Engineering Materials / B. Taljat, T. Zacharia and G.M. Pharr.".
- catalog title "Fundamentals of nanoindentation and nanotribology : symposium held April 13-17, 1998, San Francisco, California, U.S.A. / editors, Neville R. Moody ... [et al.].".
- catalog type "Conference proceedings. fast".
- catalog type "San Francisco (Calif., 1998) swd".
- catalog type "text".