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- catalog contributor b11044368.
- catalog created "c1998.".
- catalog date "1998".
- catalog date "c1998.".
- catalog dateCopyrighted "c1998.".
- catalog description "1. Introduction -- 2. Electron optics of a scanning electron microscope -- 3. Electron scattering and diffusion -- 4. Emission of backscattered and secondary electrons -- 5. Electron detectors and spectrometers -- 6. Image contrast and signal processing -- 7. Electron-beam-induced current and cathodoluminescence -- 8. Special techniques in SEM -- 9. Crystal structure analysis by diffraction -- 10. Elemental analysis and imaging with X-rays.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xiv, 527 p. :".
- catalog identifier "3540639764 (hardcover ; alk. paper)".
- catalog isPartOf "Springer series in optical sciences ; v. 45".
- catalog issued "1998".
- catalog issued "c1998.".
- catalog language "eng".
- catalog publisher "Berlin ; New York : Springer,".
- catalog subject "502/.8/25 21".
- catalog subject "QH212.S3 R452 1998".
- catalog subject "Scanning electron microscopy.".
- catalog tableOfContents "1. Introduction -- 2. Electron optics of a scanning electron microscope -- 3. Electron scattering and diffusion -- 4. Emission of backscattered and secondary electrons -- 5. Electron detectors and spectrometers -- 6. Image contrast and signal processing -- 7. Electron-beam-induced current and cathodoluminescence -- 8. Special techniques in SEM -- 9. Crystal structure analysis by diffraction -- 10. Elemental analysis and imaging with X-rays.".
- catalog title "Scanning electron microscopy : physics of image formation and microanalysis / Ludwig Reimer.".
- catalog type "text".