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- catalog abstract "The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool for investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.".
- catalog contributor b11046843.
- catalog created "c1999.".
- catalog date "1999".
- catalog date "c1999.".
- catalog dateCopyrighted "c1999.".
- catalog description "Includes bibliographical references (p. [179]-191) and index.".
- catalog description "Introduction -- Reflectivity of X-Rays from Surfaces and Interfaces -- Reflectivity Experiments -- Advanced Techniques -- Statistical Description of Surfaces and Interfaces -- Off-Specular Scattering -- Scattering with Coherent Radiation -- Closing Remarks.".
- catalog description "The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science.They are also very exciting with respect to fundamental questions: When liquids and polymers form thin films, they may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool for investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.".
- catalog extent "viii, 197 p. :".
- catalog identifier "3540651829 (alk. paper)".
- catalog isPartOf "Springer tracts in modern physics, 0081-3869 ; 148".
- catalog issued "1999".
- catalog issued "c1999.".
- catalog language "eng".
- catalog publisher "Berlin ; New York : Springer,".
- catalog subject "530.4/275 21".
- catalog subject "Chemistry.".
- catalog subject "Particles (Nuclear physics).".
- catalog subject "QC176.9.M84 T65 1998".
- catalog subject "Soft condensed matter.".
- catalog subject "Surfaces (Physics).".
- catalog subject "Thin films, Multilayered Scattering.".
- catalog subject "X-rays Scattering.".
- catalog tableOfContents "Introduction -- Reflectivity of X-Rays from Surfaces and Interfaces -- Reflectivity Experiments -- Advanced Techniques -- Statistical Description of Surfaces and Interfaces -- Off-Specular Scattering -- Scattering with Coherent Radiation -- Closing Remarks.".
- catalog title "X-ray scattering from soft-matter thin films : materials science and basic research / Metin Tolan.".
- catalog type "text".