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- catalog abstract "This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.".
- catalog contributor b11054842.
- catalog contributor b11054843.
- catalog contributor b11054844.
- catalog contributor b11054845.
- catalog created "c1999.".
- catalog date "1999".
- catalog date "c1999.".
- catalog dateCopyrighted "c1999.".
- catalog description "1. Basic Elements of the Equipment -- 2. Diffractometers and Reflectometers -- 3. Scans and Resolution in Angular and Reciprocal Space -- 4. Basic Principles -- 5. Kinematical Scattering Theory -- 6. Dynamical Scattering Theory -- 7. Layer Thicknesses of Single Layers and Multilayers -- 8. Lattice Parameters and Lattice Strains in Single Epitaxial Layers -- 9. Volume Defects in Layers -- 10. X-Ray Reflection by Rough Multilayers -- 11. X-Ray Scattering by Gratings and Dots -- A. Wave Vectors and Amplitudes of the Internal Wavefields in a Dynamically Scattering Crystal -- Index.".
- catalog description "Includes bibliographical references ([243]-246) and index.".
- catalog description "This critical overview presents experimental methods for solving most frequent strucutral problems of mono-crystalline thin films and layered systems: thickness, crystalline state, strain distribution, interface quality and other properties. A unified theoretical approach based on kinematical and dynamical scattering theories describes the experimental methods. This book is a ready-to-hand reference for experimentalists who want to improve their knowledge on modern x-ray methods for thin-film analysis.".
- catalog extent "xi, 256 p. :".
- catalog identifier "354062029X (hardcover : alk. paper)".
- catalog isPartOf "Springer tracts in modern physics ; 149.".
- catalog isPartOf "Springer tracts in modern physics ; vol. 149".
- catalog issued "1999".
- catalog issued "c1999.".
- catalog language "eng".
- catalog publisher "Berlin ; New York : Springer,".
- catalog subject "539 s 530.4/175 21".
- catalog subject "Crystallography.".
- catalog subject "Physics.".
- catalog subject "QC1 .S797 vol. 149 QC176.84.O7".
- catalog subject "Spectrum analysis.".
- catalog subject "Surfaces (Physics).".
- catalog subject "Thin films Optical properties.".
- catalog subject "Thin films, Multilayered Optical properties.".
- catalog subject "X-rays Diffraction.".
- catalog subject "X-rays Scattering.".
- catalog tableOfContents "1. Basic Elements of the Equipment -- 2. Diffractometers and Reflectometers -- 3. Scans and Resolution in Angular and Reciprocal Space -- 4. Basic Principles -- 5. Kinematical Scattering Theory -- 6. Dynamical Scattering Theory -- 7. Layer Thicknesses of Single Layers and Multilayers -- 8. Lattice Parameters and Lattice Strains in Single Epitaxial Layers -- 9. Volume Defects in Layers -- 10. X-Ray Reflection by Rough Multilayers -- 11. X-Ray Scattering by Gratings and Dots -- A. Wave Vectors and Amplitudes of the Internal Wavefields in a Dynamically Scattering Crystal -- Index.".
- catalog title "High-resolution X-ray scattering from thin films and multilayers / Vaclav Holy, Ullrich Pietsch, Tilo Baumbach.".
- catalog type "text".