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- catalog contributor b11075253.
- catalog contributor b11075254.
- catalog created "c1998.".
- catalog date "1998".
- catalog date "c1998.".
- catalog dateCopyrighted "c1998.".
- catalog description "Includes bibliographical references (p. 645-663) and indexes.".
- catalog extent "xxii, 680 p. :".
- catalog identifier "0471143286 (cloth : alk. paper)".
- catalog isPartOf "Wiley series in probability and statistics. Applied probability and statistics section".
- catalog isPartOf "Wiley series in probability and statistics. Applied probability and statistics.".
- catalog issued "1998".
- catalog issued "c1998.".
- catalog language "eng".
- catalog publisher "New York : Wiley,".
- catalog subject "620/.00452 21".
- catalog subject "Reliability (Engineering) Statistical methods.".
- catalog subject "TS173 .M44 1998".
- catalog title "Statistical methods for reliability data / William Q. Meeker, Luis A. Escobar.".
- catalog type "text".