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- catalog contributor b11264825.
- catalog created "c1998.".
- catalog date "1998".
- catalog date "c1998.".
- catalog dateCopyrighted "c1998.".
- catalog description "Includes bibliographical references and index.".
- catalog description "New Directions in Instrumentation and Measurement -- pt. I. Technology. Ch. 1. Measurement Theory and System Characterization. 1.1. Unified Approach to Measurand Reconstruction / R.Z. Morawski. 1.2. Laboratory Model for Thinking of Measurement Science / K. Kariya, S. Takayama and H. Kochi. 1.3. On the Use of System Identification for Accurate Parametric Modeling of Nonlinear Systems Using Noisy Measurements / G. Vandersteen, Y. Rolain and J. Schoukens [and others]. 1.4. Determination of Parameter Estimation Errors Due to Noise and Undermodelling / M. Knudsen. Ch. 2. Metrology, Standards and Calibration. 2.1. Metrology: Quo Vadis? / D. Kind and T. Quinn.".
- catalog extent "xx, 521 p. :".
- catalog identifier "0780342682".
- catalog isPartOf "IEEE technology update series".
- catalog issued "1998".
- catalog issued "c1998.".
- catalog language "eng".
- catalog publisher "New York : Institute of Electrical and Electronics Engineers,".
- catalog subject "620/.0044 21".
- catalog subject "Detectors.".
- catalog subject "Electronic instruments.".
- catalog subject "Measurement.".
- catalog subject "Optoelectronics.".
- catalog subject "TK7878.4 .I528 1998".
- catalog tableOfContents "New Directions in Instrumentation and Measurement -- pt. I. Technology. Ch. 1. Measurement Theory and System Characterization. 1.1. Unified Approach to Measurand Reconstruction / R.Z. Morawski. 1.2. Laboratory Model for Thinking of Measurement Science / K. Kariya, S. Takayama and H. Kochi. 1.3. On the Use of System Identification for Accurate Parametric Modeling of Nonlinear Systems Using Noisy Measurements / G. Vandersteen, Y. Rolain and J. Schoukens [and others]. 1.4. Determination of Parameter Estimation Errors Due to Noise and Undermodelling / M. Knudsen. Ch. 2. Metrology, Standards and Calibration. 2.1. Metrology: Quo Vadis? / D. Kind and T. Quinn.".
- catalog title "Instrumentation and measurement technology and applications / Emil M. Petriu, editor.".
- catalog type "text".