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- catalog abstract "The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.".
- catalog alternative "Applied reflection high-energy electron diffraction".
- catalog contributor b11271816.
- catalog created "c1999.".
- catalog date "1999".
- catalog date "c1999.".
- catalog dateCopyrighted "c1999.".
- catalog description "Includes bibliographical references (p. [200]-210) and index.".
- catalog description "MBE-Grown Semiconductor Interfaces -- Reflection High-Energy Electron Diffraction (RHEED) -- RHEED Intensity Oscillations -- Semi-Kinematical Simulation of RHEED Patterns -- Kikuchi Lines -- RHEED with Rotating Substrates -- Growth-Induced Phase Shifts of RHEED Oscillations -- Electron Energy Loss Spectroscopy during Growth -- Phase Shifts: Models -- Ga Segregation at AIAs/GaAs Interfaces -- Modifying the Surface Reconstruction: Tin doping -- Modifying the Surface Morphology: C doping -- Silicon Doping -- Conclusions.".
- catalog description "The book describes RHEED (reflection high-energy electron diffraction) used as a tool for crystal growth. New methods using RHEED to characterize surfaces and interfaces during crystal growth by MBE (molecular beam epitaxy) are presented. Special emphasis is put on RHEED intensity oscillations, segregation phenomena, electron energy-loss spectroscopy and RHEED with rotating substrates.".
- catalog extent "ix, 216 p., [4] p. of plates :".
- catalog identifier "3540651993 (alk. paper)".
- catalog isPartOf "Springer tracts in modern physics, 0081-3869 ; 154".
- catalog issued "1999".
- catalog issued "c1999.".
- catalog language "eng".
- catalog publisher "Berlin ; New York : Springer,".
- catalog subject "537.6/22 21".
- catalog subject "Condensed matter.".
- catalog subject "Crystal growth.".
- catalog subject "Molecular beam epitaxy.".
- catalog subject "Physics.".
- catalog subject "QC611.3.M64 B7 1999".
- catalog subject "Reflection high energy electron diffraction.".
- catalog subject "Weights and measures.".
- catalog tableOfContents "MBE-Grown Semiconductor Interfaces -- Reflection High-Energy Electron Diffraction (RHEED) -- RHEED Intensity Oscillations -- Semi-Kinematical Simulation of RHEED Patterns -- Kikuchi Lines -- RHEED with Rotating Substrates -- Growth-Induced Phase Shifts of RHEED Oscillations -- Electron Energy Loss Spectroscopy during Growth -- Phase Shifts: Models -- Ga Segregation at AIAs/GaAs Interfaces -- Modifying the Surface Reconstruction: Tin doping -- Modifying the Surface Morphology: C doping -- Silicon Doping -- Conclusions.".
- catalog title "Applied RHEED : reflection high-energy electron diffraction during crystal growth / Wolfgang Braun.".
- catalog title "Applied reflection high-energy electron diffraction".
- catalog type "text".