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- catalog alternative "Interference, interferometry, and interferometric metrology".
- catalog contributor b11331183.
- catalog contributor b11331184.
- catalog created "c1995.".
- catalog date "1995".
- catalog date "c1995.".
- catalog dateCopyrighted "c1995.".
- catalog description "Includes bibliographical references and indexes.".
- catalog extent "xv, 701 p. :".
- catalog hasFormat "Selected papers on interference, interferometry, and interferometric metrology.".
- catalog identifier "0819419362 (alk. paper)".
- catalog isFormatOf "Selected papers on interference, interferometry, and interferometric metrology.".
- catalog isPartOf "SPIE milestone series ; v. MS 110".
- catalog issued "1995".
- catalog issued "c1995.".
- catalog language "eng".
- catalog publisher "Bellingham, Wash. : SPIE Optical Engineering Press,".
- catalog relation "Selected papers on interference, interferometry, and interferometric metrology.".
- catalog subject "621.36 20".
- catalog subject "Interference (Light)".
- catalog subject "Interferometry.".
- catalog subject "QC411 .S44 1995".
- catalog title "Interference, interferometry, and interferometric metrology".
- catalog title "Selected papers on interference, interferometry, and interferometric metrology / editors, P. Hariharan, Daniel Malacara.".
- catalog type "text".