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- catalog abstract "An important managerial problem in product design is the extent to which testing activities are carried out in parallel or in series. parallel testing has the advantage of proceeding more rapidly than serials testing but does not take advantage of the potential for learning between tests, thus resulting in a larger number of tests. We model this trade-off in form of a dynamic program and derive the optimal testing strategy (or mix of parallel and serial testing) that minimizes both the total cost and time of testing. We derive the optimal testing strategy as a function of testing cost, prior knowledge, and testing lead-time. Using information theory to measure the amount of learning between tests, we further show that in the case of imperfect testing (due to noise or simulated test conditions) the attractiveness of parallel stategies increases. Finally, we analyze the relationship between testing strategies and the structure of design hierarchy. We show that a key benefit of modular product architecture lies in the reduction of testing cost.".
- catalog contributor b11415824.
- catalog contributor b11415825.
- catalog contributor b11415826.
- catalog contributor b11415827.
- catalog created "c1999.".
- catalog date "1999".
- catalog date "c1999.".
- catalog dateCopyrighted "c1999.".
- catalog description "An important managerial problem in product design is the extent to which testing activities are carried out in parallel or in series. parallel testing has the advantage of proceeding more rapidly than serials testing but does not take advantage of the potential for learning between tests, thus resulting in a larger number of tests. We model this trade-off in form of a dynamic program and derive the optimal testing strategy (or mix of parallel and serial testing) that minimizes both the total cost and time of testing. We derive the optimal testing strategy as a function of testing cost, prior knowledge, and testing lead-time. Using information theory to measure the amount of learning between tests, we further show that in the case of imperfect testing (due to noise or simulated test conditions) the attractiveness of parallel stategies increases. Finally, we analyze the relationship between testing strategies and the structure of design hierarchy. We show that a key benefit of modular product architecture lies in the reduction of testing cost.".
- catalog description "Includes bibliographical references (p. 21-24).".
- catalog extent "30, [2] p. :".
- catalog isPartOf "Working paper (Harvard University. Graduate School of Business Administration. Division of Research) ; 00-024.".
- catalog isPartOf "Working paper / Division of Research, Harvard Business School ; 00-024".
- catalog issued "1999".
- catalog issued "c1999.".
- catalog language "eng".
- catalog publisher "[Boston] : Division of Research, Harvard Business School,".
- catalog title "Parallel and sequential testing of design alternatives / Christoph Loch, Christian Terwiesch, Stefan Thomke.".
- catalog type "text".