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- catalog contributor b11477861.
- catalog contributor b11477862.
- catalog created "1978.".
- catalog date "1978".
- catalog date "1978.".
- catalog dateCopyrighted "1978.".
- catalog description "Includes bibliographical references.".
- catalog extent "339 p. :".
- catalog identifier "0890720622".
- catalog isPartOf "Annals of the New York Academy of Sciences ; v. 306 0077-8923".
- catalog isPartOf "Annals of the New York Academy of Sciences ; v. 306.".
- catalog issued "1978".
- catalog issued "1978.".
- catalog language "eng".
- catalog publisher "New York : New York Academy of Sciences,".
- catalog subject "508/.1 s 502/.8".
- catalog subject "Electron microscopy Congresses.".
- catalog subject "Microscopy Congresses.".
- catalog subject "Microscopy, Electron Congresses.".
- catalog subject "Q11 .N5 vol. 306 QH212.E4".
- catalog subject "Scattering (Physics) Congresses.".
- catalog subject "Scattering, Radiation Congresses.".
- catalog subject "W1 AN626YL v.306 1978".
- catalog title "Short wavelength microscopy / edited by Donald F. Parsons.".
- catalog type "Conference proceedings. fast".
- catalog type "text".