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- catalog alternative "Speckle metrology".
- catalog alternative "Speckle metrology.".
- catalog contributor b11492983.
- catalog contributor b11492984.
- catalog created "c1991.".
- catalog date "1991".
- catalog date "c1991.".
- catalog dateCopyrighted "c1991.".
- catalog description "Includes bibliographical references and indexes.".
- catalog extent "xviii, 668 p. :".
- catalog hasFormat "Selected papers on speckle metrology.".
- catalog identifier "0819406384 (hardbound)".
- catalog identifier "0819406392 (softbound)".
- catalog isFormatOf "Selected papers on speckle metrology.".
- catalog isPartOf "SPIE milestone series ; v. MS 35".
- catalog issued "1991".
- catalog issued "c1991.".
- catalog language "eng".
- catalog publisher "Bellingham, Wash., USA : SPIE Optical Engineering Press,".
- catalog relation "Selected papers on speckle metrology.".
- catalog subject "681/.2 20".
- catalog subject "Holographic interferometry.".
- catalog subject "Speckle metrology.".
- catalog subject "TA1555 .S45 1991".
- catalog title "Selected papers on speckle metrology / Rajpal S. Sirohi, editor.".
- catalog title "Speckle metrology".
- catalog type "text".