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• catalog abstract "This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations.".
• catalog contributor b11497378.
• catalog created "c1993.".
• catalog date "1993".
• catalog date "c1993.".
• catalog dateCopyrighted "c1993.".
• catalog description "Chapter 4. Wavefront sensors. 4.1. Introduction; 4.2. Principles of operation; 4.3. Direct measure of W(x, y): point diffraction interferometer; 4.4. Measures of differential wavefront (dW); 4.5. Measures of transverse ray error (T); 4.6. References -- Chapter 5. General light beam measurements. 5.1. Introduction; 5.2. Power-related measurements; 5.3. Color; 5.4. Coherence measurements; 5.5. Polarization; 5.6. Directionality (pointing): beam tilt sensing; 5.7. References -- Chapter 6. Component measurements. 6.1. Introduction; 6.2. Radius of curvature; 6.3. Refractive index; 6.4. Spectral transmission; 6.5. Collimation; 6.6. Surface roughness; 6.7. Light scattering; 6.8. Ellipsometry; 6.9. Instruments for (black and white) photographic film; 6.10. Extended source brightness (radiance); 6.11. References -- Index.".
• catalog description "Includes bibliographical references and index.".
• catalog description "Preface -- Chapter 1. Optical bench measurements on imaging systems. 1.1. Introduction; 1.2. Effective focal length; 1.3. f-number; 1.4. Axial color; 1.5. Field curvature and distortion; 1.6. Transmission; 1.7. Relative illumination falloff; 1.8. Veiling glare; 1.9. Thermal behavior; 1.10. References -- Appendix 1.1. Basic geometrical optics -- Appendix 1.2. Relative illumination falloff -- Chapter 2. Aberration and resolution measurements. 2.1. Introduction; 2.2. Spherical aberration; 2.3. Astigmatism; 2.4. Coma; 2.5. Image resolution; 2.6. Modulation transfer function tests; 2.7. References -- Chapter 3. Interferometric testing of optical systems. 3.1. Introduction; 3.2. Mathematical description of aberrations; 3.3. Fizeau interferometer; 3.4. Analyzing an interferogram; 3.5. Testing a lens; 3.6. Retrace error; 3.7. Collecting and handling data; 3.8. Environmental constraints; 3.9. Mounting; 3.10. References -- Appendix 3.1. Testing configurations using a Fizeau interferometer.".
• catalog description "This volume in the SPIE Tutorial Text series presents a practical approach to optical testing, with emphasis on techniques, procedures, and instrumentation rather than mathematical analysis. The author provides the reader with a basic understanding of the measurements made and the tools used to make those measurements. Detailed information is given on how to measure and characterize imaging systems, perform optical bench measurements to determine first- and third-order properties of optical systems, set up and operate a Fizeau interferometer and evaluate fringe data, conduct beam diagnostics (such as wavefront sensing), and perform radiometric calibrations.".
• catalog extent "xii, 146 p. :".
• catalog identifier "0819413127".
• catalog identifier "0819413771".
• catalog isPartOf "Tutorial texts in optical engineering ; TT 15".
• catalog isPartOf "Tutorial texts in optical engineering ; v. TT 15.".
• catalog issued "1993".
• catalog issued "c1993.".
• catalog language "eng".
• catalog publisher "Bellingham, Wash., USA : SPIE Optical Engineering Press,".
• catalog subject "681/.4/0287 20".
• catalog subject "Electronic instruments.".
• catalog subject "Optical instruments Testing.".
• catalog subject "TS514 .G43 1993".
• catalog tableOfContents "Chapter 4. Wavefront sensors. 4.1. Introduction; 4.2. Principles of operation; 4.3. Direct measure of W(x, y): point diffraction interferometer; 4.4. Measures of differential wavefront (dW); 4.5. Measures of transverse ray error (T); 4.6. References -- Chapter 5. General light beam measurements. 5.1. Introduction; 5.2. Power-related measurements; 5.3. Color; 5.4. Coherence measurements; 5.5. Polarization; 5.6. Directionality (pointing): beam tilt sensing; 5.7. References -- Chapter 6. Component measurements. 6.1. Introduction; 6.2. Radius of curvature; 6.3. Refractive index; 6.4. Spectral transmission; 6.5. Collimation; 6.6. Surface roughness; 6.7. Light scattering; 6.8. Ellipsometry; 6.9. Instruments for (black and white) photographic film; 6.10. Extended source brightness (radiance); 6.11. References -- Index.".
• catalog tableOfContents "Preface -- Chapter 1. Optical bench measurements on imaging systems. 1.1. Introduction; 1.2. Effective focal length; 1.3. f-number; 1.4. Axial color; 1.5. Field curvature and distortion; 1.6. Transmission; 1.7. Relative illumination falloff; 1.8. Veiling glare; 1.9. Thermal behavior; 1.10. References -- Appendix 1.1. Basic geometrical optics -- Appendix 1.2. Relative illumination falloff -- Chapter 2. Aberration and resolution measurements. 2.1. Introduction; 2.2. Spherical aberration; 2.3. Astigmatism; 2.4. Coma; 2.5. Image resolution; 2.6. Modulation transfer function tests; 2.7. References -- Chapter 3. Interferometric testing of optical systems. 3.1. Introduction; 3.2. Mathematical description of aberrations; 3.3. Fizeau interferometer; 3.4. Analyzing an interferogram; 3.5. Testing a lens; 3.6. Retrace error; 3.7. Collecting and handling data; 3.8. Environmental constraints; 3.9. Mounting; 3.10. References -- Appendix 3.1. Testing configurations using a Fizeau interferometer.".
• catalog title "Introduction to optical testing / Joseph M. Geary.".
• catalog type "text".