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- catalog alternative "Certification of one hundred millimeter diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements".
- catalog contributor b11503301.
- catalog contributor b11503302.
- catalog contributor b11503303.
- catalog created "1999.".
- catalog date "1999".
- catalog date "1999.".
- catalog dateCopyrighted "1999.".
- catalog description "Includes bibliographical references (p. 44-45).".
- catalog extent "vi, 106 p. :".
- catalog isPartOf "NIST special publication ; 260-131".
- catalog isPartOf "Standard reference materials".
- catalog issued "1999".
- catalog issued "1999.".
- catalog language "eng".
- catalog publisher "Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O.,".
- catalog subject "Silicon Electric properties.".
- catalog subject "Silicon.".
- catalog title "Certification of one hundred millimeter diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements".
- catalog title "The certification of 100 mm diameter silicon resistivity SRMs 2541 through 2547 using dual-configuration four-point probe measurements [microform] / J.R. Ehrstein, M.C. Croarkin.".
- catalog type "text".