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catalog contributor b11675557.
catalog created "c2000.".
catalog date "2000".
catalog date "c2000.".
catalog dateCopyrighted "c2000.".
catalog description "Daisuke Takeuchi, Hideyuki Watanabe, Sadanori Yamanaka, Hideyo Okushi, Koji Kajimura, Hidetaka Sawada, Hideki Ichinose, Takashi Sekiguchi 87 -- Spectrally Resolved Cathodoluminescence Determination of Dopant Diffusion in InP/InGaAsP Based Multi Quantum Well Fabry-Perot Lasers / C. Zanotti-Fregonara, C. Ferrari, L. Lazzarini, G. Salviati, M. Meliga, D. Bertone, R.Y. Fang, G. Morello, R. Paoletti 93 -- Optical Properties of Si Nanowires on a Si{111} Surface / N. Ozaki, Y. Ohno, S. Takeda 99 -- Mesoscopic Characterization of the Optical Property of Antiphase Boundaries in CuPt-Ordered GaInP[subscript 2] / Y. Ohno, S. Takeda 105 -- Homogeneity of Thermally-Annealed Lightly Fe-Doped SI InP / M. Avella, J. Jimenez, R. Fornari, E. de la Puente 111 -- Study of the Radiative and Non-Radiative Recombination Processes at Dislocations in Silicon by Photoluminescence and LBIC Measurements / S. Pizzini, S. Binetti, M. Acciarri, M. Casati 117 --".
catalog description "E. Borchi, M. Bruzzi, L. Lombardi, D. Menichelli, S. Miglio, S. Pirollo, S. Sciortino, D. Serafini 277 -- Microvoids in Polycrystalline CVD Diamond / Karen M. McNamara 283 -- Photoemitters Based on Glass-ITO Structures / J. Olesik 291 -- Determination of Optical Properties of Fluorocarbon Polymer Thin Films by a Variable Angle Spectroscopic Ellipsometry / Kang-Kuk Lee, Jin-Goo Park, Hyung-Jae Shin 297 -- Optically Induced Condensation of Impurity Excitations in Transparent Solids / E.A. Manykin, M.I. Ojovan, P.P. Poluektov 303 -- Hybridization in Electronic States and Optical Properties of Covalent Amorphous Semiconductors / Yuzo Shinozuka 309 -- Viewport Influence on Optical Pyrometry and Deposition Process in MOCVD Vertical Rotating Disc Reactors / Anton Prokopenko, Alexander Gurary, Vadim Boguslavskiy, Jeffrey Ramer, Matthew Schurman 315 --".
catalog description "Energy Behavior With Magnetic Field of Negatively Charged Magneto-Excitons in Quantum Wells and Heterojunctions / F.M. Munteanu, Y. Kim, C.H. Perry, D.G. Rickel, J.A. Simmons, J.L. Reno 321.".
catalog description "I.M. Tiginyanu, M.A. Stevens Kalceff, A. Sarua, G. Irmer, J. Monecke, O. Cojocari, H.L. Hartnagel 161 -- Study of Raman Scattering of InP/InGaAs/InP HEMTs / K. Radhakrishnan, T.H.K. Patrick, H.Q. Zheng, S.F. Yoon 167 -- Optical Properties -- Optical and Microstructural Characterization of Nanocrystalline Silicon Superlattices / L. Tsybeskov, G.F. Grom, R. Krishnan, P.M. Fauchet, J.P. McCaffrey, J-M. Baribeau, G.I. Sproule, D.J. Lockwood, V. Timoshenko, J. Diener, H. Heckler, D. Kovalev, F. Koch, T.N. Blanton 173 -- Microstructural Characterization of Antimonide Based III-V Compounds and Their Effect on Electro-Optical Properties of Substrate Materials and Devices / P.S. Dutta, R.J. Gutmann, G.W. Charache, C.A. Wang 187 -- Optical Properties of Pseudomorphic Sn[subscript x]Ge[subscript 1-x] Alloys / Regina Ragan, Harry A. Atwater 199 -- Optical Microstructural Characterization of Semiconductors--Posters --".
catalog description "Includes bibliographical references and indexes.".
catalog description "N. Yamamoto, T. Mita, S. Heun, A. Franciosi, J-M. Bonard 245 -- Studies of Photoreflectance in Cd[subscript 1-x]Mn[subscript x]Te/Cd[subscript 1-y]Mn[subscript y]Te Superlattices / Chenjia Chen, Xuezhong Wang, Haitao Li, Xiaogan Liang, Guangyu Chai, Zheng Ning, Xun Wang 251 -- Nondestructive Analysis of Current Gain of InP/InGaAs Heterojunction Bipolar Transistor Structures Using Photoreflectance Spectroscopy / Hiroki Sugiyama, Noriyuki Watanabe, Kazuo Watanabe, Takashi Kobayashi, Kazumi Wada 257 -- Quantum Confinement of Above-Band-Gap Transitions in Ge Quantum Dots / C.W. Teng, J.F. Muth, R.M. Kolbas, K.M. Hassan, A.K. Sharma, A. Kvit, J. Narayan 263 -- Effects of Rapid Thermal Annealing on the Intersubband Energy Spacing of Self-Assembled InAs/GaAs Quantum Dots / X.C. Wang, S.J. Chua, S.J. Xu, Z.H. Zhang 269 -- Photo-Induced Current Spectroscopy in Undoped CVD Diamond Films /".
catalog description "Near-Field Techniques -- Internal Spatial Modes and Local Propagation Properties in Optical Waveguides Measured Using Near-Field Scanning Optical Microscopy / Bennett B. Goldberg, M. Selim Unlu, Greg Vander Rhodes 3 -- Photoreflectance Near-Field Scanning Optical Microscopy / Charles Paulson, Brian Hawkins, Jingxi Sun, Arthur B. Ellis, Leon McCaughan, T.F. Kuech 13 -- Scanning Tunneling Microscope-Induced Luminescence Studies of Defects in GaN Layers and Heterostructures / S. Evoy, C.K. Harnett, S. Keller, U.K. Mishra, S.P. DenBaars, H.G. Craighead 19 -- Optical Characterization of Individual Nanostructures by STM Light Emission / S. Ushioda 25 -- Optical Integrated Waveguides Characterization by Scanning Near-Field Optical Microscope / X. Borrise, N. Barniol, F. Perez-Murano, G. Abadal, X. Aymerich, D. Jimenez 37 -- STM-Light Emission From Metal Deposited Semiconductor Surfaces / N. Yamamoto, S. Kagami, H. Minoda 43 --".
catalog description "Optical Absorption and Luminescence Study of the Effect of Thermal Treatments on the Porous Silicon Surface / R. Plugaru, G. Cracium, M. Bercu, J. Rams, J. Piqueras 209 -- Optical Characterization of Ion Implanted SiC / E.K. Williams, D. Ila, D.B. Poker, D.K. Hensley 215 -- Analysis of the Crystallization Kinetics and Microstructure of Polycrystalline SiGe Films by Optical Techniques / J. Olivares, P. Martin, A. Rodriguez, J. Sangrador, O. Martinez, J. Jimenez, T. Rodriguez 221 -- Micro-Raman Characterization of Unusual Defect Structure in Arsenic-Implanted Silicon / David D. Tuschel, James P. Lavine 227 -- Confocal Micro-Raman Characterization of SiC Epilayers / Ran Liu 233 -- Study of GaSb Junction Devices by Cathodoluminescence and Scanning Tunneling Spectroscopy / P. Hidalgo, B. Mendez, J. Piqueras, P.S. Dutta 239 -- Cathodoluminescence From In[subscript x]Ga[subscript 1-x]As Layers Grown on GaAs Using a Transmission Electron Microscope /".
catalog description "Optical Emission Related to Holes Confined in p-Type [delta]-Doped Layers in GaAs / Q.X. Zhao, M. Willander, P.O. Holtz, W. Lu, H.F. Dou, S.C. Shen, G. Li, C. Jagadish 123 -- Characterization of Si, SiGe and SOI Structures Using Photoluminescence / V. Higgs 129 -- Photoluminescence and Photoluminescence Excitation Mechanisms for Porous Silicon and Silicon Oxynitride / Xingsheng Liu, Jesus Noel Calata, Houyun Liang, Wangzhou Shi, Xuanyin Lin, Kuixun Lin, G.G. Qin 141 -- Raman Spectroscopy -- Micro-Raman Characterization of Arsenic-Implanted Silicon: Interpretation of the Spectra / James P. Lavine, David D. Tuschel 149 -- Depth-Resolved Microspectroscopy of Porous Silicon Multilayers / S. Manotas, F. Agullo-Rueda, J.D. Moreno, R.J. Martin-Palma, R. Guerrero-Lemus, J.M. Martinez-Duart 155 -- Micro-Raman Study of Charge Carrier Distribution and Cathodoluminescence Microanalysis of Porous GaP Membranes /".
catalog description "Photoelectrical and Resonance Techniques -- Light-Excitation-Based Spectroscopy of Electronic Defects in Novel Materials / A. Castaldini, A. Cavallini, L. Polenta 51 -- Investigation of Deep Levels in GaP Liquid Phase Epitaxial Layers on Substrates With Vapor Pressure Heat Treatment / T.J. Yu, K. Suto, J. Nishizawa 61 -- Low-Temperature Photoluminescence Photoinduced Current Spectroscopy on CdZnTe Grown by High-Pressure Bridgman Technique / A. Zerrai, K. Cherkaoui, S. Mergui, A. Zumbiehl, M. Hage-Ali, G. Marrakchi, G. Bremond 67 -- Luminescence -- Development of Low Energy Cathodoluminescence System and its Application to the Study of ZnO Powders / Takashi Sekiguchi 75 -- Optical Properties and Defect Structure of MOVPE InGaN Films / A. Cremades, M. Albrecht, J.M. Ulloa, J. Piqueras, H.P. Strunk, D. Hanser, R.F. Davis 81 -- A Study of the Origin of Band-A Emission in Homoepitaxial Diamond Thin Films /".
catalog extent "xi, 333 p. :".
catalog hasFormat "Optical microstructural characterization of semiconductors.".
catalog identifier "1558994963".
catalog isFormatOf "Optical microstructural characterization of semiconductors.".
catalog isPartOf "Materials Research Society symposia proceedings ; v. 588.".
catalog isPartOf "Materials Research Society symposium proceedings, 0272-9172 ; v. 588".
catalog issued "2000".
catalog issued "c2000.".
catalog language "eng".
catalog publisher "Warrendale, Pa. : Materials Research Society,".
catalog relation "Optical microstructural characterization of semiconductors.".
catalog subject "621.3815/2 21".
catalog subject "Microstructure Congresses.".
catalog subject "QC610.9 .O67 2000".
catalog subject "Semiconductors Congresses.".
catalog tableOfContents "Daisuke Takeuchi, Hideyuki Watanabe, Sadanori Yamanaka, Hideyo Okushi, Koji Kajimura, Hidetaka Sawada, Hideki Ichinose, Takashi Sekiguchi 87 -- Spectrally Resolved Cathodoluminescence Determination of Dopant Diffusion in InP/InGaAsP Based Multi Quantum Well Fabry-Perot Lasers / C. Zanotti-Fregonara, C. Ferrari, L. Lazzarini, G. Salviati, M. Meliga, D. Bertone, R.Y. Fang, G. Morello, R. Paoletti 93 -- Optical Properties of Si Nanowires on a Si{111} Surface / N. Ozaki, Y. Ohno, S. Takeda 99 -- Mesoscopic Characterization of the Optical Property of Antiphase Boundaries in CuPt-Ordered GaInP[subscript 2] / Y. Ohno, S. Takeda 105 -- Homogeneity of Thermally-Annealed Lightly Fe-Doped SI InP / M. Avella, J. Jimenez, R. Fornari, E. de la Puente 111 -- Study of the Radiative and Non-Radiative Recombination Processes at Dislocations in Silicon by Photoluminescence and LBIC Measurements / S. Pizzini, S. Binetti, M. Acciarri, M. Casati 117 --".
catalog tableOfContents "E. Borchi, M. Bruzzi, L. Lombardi, D. Menichelli, S. Miglio, S. Pirollo, S. Sciortino, D. Serafini 277 -- Microvoids in Polycrystalline CVD Diamond / Karen M. McNamara 283 -- Photoemitters Based on Glass-ITO Structures / J. Olesik 291 -- Determination of Optical Properties of Fluorocarbon Polymer Thin Films by a Variable Angle Spectroscopic Ellipsometry / Kang-Kuk Lee, Jin-Goo Park, Hyung-Jae Shin 297 -- Optically Induced Condensation of Impurity Excitations in Transparent Solids / E.A. Manykin, M.I. Ojovan, P.P. Poluektov 303 -- Hybridization in Electronic States and Optical Properties of Covalent Amorphous Semiconductors / Yuzo Shinozuka 309 -- Viewport Influence on Optical Pyrometry and Deposition Process in MOCVD Vertical Rotating Disc Reactors / Anton Prokopenko, Alexander Gurary, Vadim Boguslavskiy, Jeffrey Ramer, Matthew Schurman 315 --".
catalog tableOfContents "Energy Behavior With Magnetic Field of Negatively Charged Magneto-Excitons in Quantum Wells and Heterojunctions / F.M. Munteanu, Y. Kim, C.H. Perry, D.G. Rickel, J.A. Simmons, J.L. Reno 321.".
catalog tableOfContents "I.M. Tiginyanu, M.A. Stevens Kalceff, A. Sarua, G. Irmer, J. Monecke, O. Cojocari, H.L. Hartnagel 161 -- Study of Raman Scattering of InP/InGaAs/InP HEMTs / K. Radhakrishnan, T.H.K. Patrick, H.Q. Zheng, S.F. Yoon 167 -- Optical Properties -- Optical and Microstructural Characterization of Nanocrystalline Silicon Superlattices / L. Tsybeskov, G.F. Grom, R. Krishnan, P.M. Fauchet, J.P. McCaffrey, J-M. Baribeau, G.I. Sproule, D.J. Lockwood, V. Timoshenko, J. Diener, H. Heckler, D. Kovalev, F. Koch, T.N. Blanton 173 -- Microstructural Characterization of Antimonide Based III-V Compounds and Their Effect on Electro-Optical Properties of Substrate Materials and Devices / P.S. Dutta, R.J. Gutmann, G.W. Charache, C.A. Wang 187 -- Optical Properties of Pseudomorphic Sn[subscript x]Ge[subscript 1-x] Alloys / Regina Ragan, Harry A. Atwater 199 -- Optical Microstructural Characterization of Semiconductors--Posters --".
catalog tableOfContents "N. Yamamoto, T. Mita, S. Heun, A. Franciosi, J-M. Bonard 245 -- Studies of Photoreflectance in Cd[subscript 1-x]Mn[subscript x]Te/Cd[subscript 1-y]Mn[subscript y]Te Superlattices / Chenjia Chen, Xuezhong Wang, Haitao Li, Xiaogan Liang, Guangyu Chai, Zheng Ning, Xun Wang 251 -- Nondestructive Analysis of Current Gain of InP/InGaAs Heterojunction Bipolar Transistor Structures Using Photoreflectance Spectroscopy / Hiroki Sugiyama, Noriyuki Watanabe, Kazuo Watanabe, Takashi Kobayashi, Kazumi Wada 257 -- Quantum Confinement of Above-Band-Gap Transitions in Ge Quantum Dots / C.W. Teng, J.F. Muth, R.M. Kolbas, K.M. Hassan, A.K. Sharma, A. Kvit, J. Narayan 263 -- Effects of Rapid Thermal Annealing on the Intersubband Energy Spacing of Self-Assembled InAs/GaAs Quantum Dots / X.C. Wang, S.J. Chua, S.J. Xu, Z.H. Zhang 269 -- Photo-Induced Current Spectroscopy in Undoped CVD Diamond Films /".
catalog tableOfContents "Near-Field Techniques -- Internal Spatial Modes and Local Propagation Properties in Optical Waveguides Measured Using Near-Field Scanning Optical Microscopy / Bennett B. Goldberg, M. Selim Unlu, Greg Vander Rhodes 3 -- Photoreflectance Near-Field Scanning Optical Microscopy / Charles Paulson, Brian Hawkins, Jingxi Sun, Arthur B. Ellis, Leon McCaughan, T.F. Kuech 13 -- Scanning Tunneling Microscope-Induced Luminescence Studies of Defects in GaN Layers and Heterostructures / S. Evoy, C.K. Harnett, S. Keller, U.K. Mishra, S.P. DenBaars, H.G. Craighead 19 -- Optical Characterization of Individual Nanostructures by STM Light Emission / S. Ushioda 25 -- Optical Integrated Waveguides Characterization by Scanning Near-Field Optical Microscope / X. Borrise, N. Barniol, F. Perez-Murano, G. Abadal, X. Aymerich, D. Jimenez 37 -- STM-Light Emission From Metal Deposited Semiconductor Surfaces / N. Yamamoto, S. Kagami, H. Minoda 43 --".
catalog tableOfContents "Optical Absorption and Luminescence Study of the Effect of Thermal Treatments on the Porous Silicon Surface / R. Plugaru, G. Cracium, M. Bercu, J. Rams, J. Piqueras 209 -- Optical Characterization of Ion Implanted SiC / E.K. Williams, D. Ila, D.B. Poker, D.K. Hensley 215 -- Analysis of the Crystallization Kinetics and Microstructure of Polycrystalline SiGe Films by Optical Techniques / J. Olivares, P. Martin, A. Rodriguez, J. Sangrador, O. Martinez, J. Jimenez, T. Rodriguez 221 -- Micro-Raman Characterization of Unusual Defect Structure in Arsenic-Implanted Silicon / David D. Tuschel, James P. Lavine 227 -- Confocal Micro-Raman Characterization of SiC Epilayers / Ran Liu 233 -- Study of GaSb Junction Devices by Cathodoluminescence and Scanning Tunneling Spectroscopy / P. Hidalgo, B. Mendez, J. Piqueras, P.S. Dutta 239 -- Cathodoluminescence From In[subscript x]Ga[subscript 1-x]As Layers Grown on GaAs Using a Transmission Electron Microscope /".
catalog tableOfContents "Optical Emission Related to Holes Confined in p-Type [delta]-Doped Layers in GaAs / Q.X. Zhao, M. Willander, P.O. Holtz, W. Lu, H.F. Dou, S.C. Shen, G. Li, C. Jagadish 123 -- Characterization of Si, SiGe and SOI Structures Using Photoluminescence / V. Higgs 129 -- Photoluminescence and Photoluminescence Excitation Mechanisms for Porous Silicon and Silicon Oxynitride / Xingsheng Liu, Jesus Noel Calata, Houyun Liang, Wangzhou Shi, Xuanyin Lin, Kuixun Lin, G.G. Qin 141 -- Raman Spectroscopy -- Micro-Raman Characterization of Arsenic-Implanted Silicon: Interpretation of the Spectra / James P. Lavine, David D. Tuschel 149 -- Depth-Resolved Microspectroscopy of Porous Silicon Multilayers / S. Manotas, F. Agullo-Rueda, J.D. Moreno, R.J. Martin-Palma, R. Guerrero-Lemus, J.M. Martinez-Duart 155 -- Micro-Raman Study of Charge Carrier Distribution and Cathodoluminescence Microanalysis of Porous GaP Membranes /".
catalog tableOfContents "Photoelectrical and Resonance Techniques -- Light-Excitation-Based Spectroscopy of Electronic Defects in Novel Materials / A. Castaldini, A. Cavallini, L. Polenta 51 -- Investigation of Deep Levels in GaP Liquid Phase Epitaxial Layers on Substrates With Vapor Pressure Heat Treatment / T.J. Yu, K. Suto, J. Nishizawa 61 -- Low-Temperature Photoluminescence Photoinduced Current Spectroscopy on CdZnTe Grown by High-Pressure Bridgman Technique / A. Zerrai, K. Cherkaoui, S. Mergui, A. Zumbiehl, M. Hage-Ali, G. Marrakchi, G. Bremond 67 -- Luminescence -- Development of Low Energy Cathodoluminescence System and its Application to the Study of ZnO Powders / Takashi Sekiguchi 75 -- Optical Properties and Defect Structure of MOVPE InGaN Films / A. Cremades, M. Albrecht, J.M. Ulloa, J. Piqueras, H.P. Strunk, D. Hanser, R.F. Davis 81 -- A Study of the Origin of Band-A Emission in Homoepitaxial Diamond Thin Films /".
catalog title "Optical microstructural characterization of semiconductors : symposium held November 29-30, 1999, Boston, Massachusetts, U.S.A. / editors, M. Selim Ünlü ... [et al.].".
catalog type "Boston (Mass., 1999) swd".
catalog type "Conference proceedings. fast".
catalog type "text".