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catalog contributor b11675566.
catalog created "c2000.".
catalog date "2000".
catalog date "c2000.".
catalog dateCopyrighted "c2000.".
catalog description "Dual Band Infrared Thermography as a NDT Tool for the Characterization of the Building Materials and Conservation Performance in Historic Structures / A. Moropoulou, N.P. Avdelidis, M. Koui, N.K. Kanellopoulos 169 -- Characterization of Hydrogen in Concrete by Cold Neutron Prompt Gamma-Ray Activation Analysis and Neutron Incoherent Scattering / Rick L. Paul, H. Heatherr Chen-Mayer, Richard M. Lindstrom, Menno Blaauw 175 -- NDE For Silicon Wafers and Thin Films -- Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy / W. Arnold, S. Amelio, S. Hirsekorn, U. Rabe 183 -- Precise Determination of Thin Metal Film Thickness With Laser-Induced Acoustic Grating Technique / A.A. Maznev, M.J. Banet, M. Gostein, R.B. Hanselman, M.A. Joffe, R. Sacco, K.A. Nelson 195 -- Quantitative Measurement of Local Carrier Concentration of Semiconductor From Displacement Current-Voltage Curve Using a Scanning Vibrating Tip /".
catalog description "High-Frequency Stroboscopic X-ray Topography Under Surface Acoustic Wave Excitation / E. Zolotoyabko 47 -- NDE for Fracture Fatigue and Corrosion -- Scanning Acoustic Microscopy and X-ray Diffraction Investigation of Near Crack Tip Stresses / S. Sathish, R.W. Martin 55 -- Development of Nondestructive Method for Prediction of Crack Instability / J.L. Schroeder, D. Eylon, E.B. Shell, T.E. Matikas 61 -- Nondestructive Characterization of Corrosion Protective Coatings on Aluminum Alloy Substrates / J. Hoffmann, S. Sathish, M. Khobaib, N. Meyendorf, U. Netzelmann, T.E. Matikas 67 -- Nondestructive Evaluation of Fatigue in Titanium Alloys / H. Rosner, N. Meyendorf, S. Sathish, T.E. Matikas 73 -- Real-Time Monitoring of Acoustic Linear and Nonlinear Behavior of Titanium Alloys During Cyclic Loading / J. Frouin, J. Maurer, S. Sathish, D. Eylon, J.K. Na, T.E. Matikas 79 -- Electric and Dielectric NDE --".
catalog description "Impedance Spectroscopy Investigation on the Low-Temperature Degradation of Tetragonal Zirconia: Influence of Measurement Conditions / A.P. Santos, R.Z. Domingues 87 -- Electrically Based Non-Destructive Microstructural Characterization of All Classes of Materials / Rosario A. Gerhardt 93 -- Non-Destructive Dielectric Assessment of Water Permeation in Composite Structures / P. Boinard, E. Boinard, R.A. Pethrick, W.M. Banks, R.L. Crane 105 -- Nondestructive Damage Evaluation of Electro-Mechanical Components Using a Hybrid, Computational and Experimental Approach / C. Furlong, R.J. Pryputniewicz 111 -- Structure-Sensitive Properties for NDE Characterization -- Role of Structure-to-Property-Relationships in Materials Characterization / W. Morgner 119 -- Nonlinear Ultrasonic Parameter in Precipitate-Hardened Steels / D.C. Hurley, D. Balzar, P.T. Purtscher 129 --".
catalog description "In Situ Monitoring of MOCVD of Aluminum Nitride by Optical Spectroscopies / S.C. Allen, H.H. Richardson 301 -- Real-Time Optical Characterization and Control of Heteroepitaxial Ga[subscript x]In[subscript 1-x]P Growth by P-Polarized Reflectance / N. Dietz, K. Ito, I. Lauko, V. Woods 307 -- Nondestructive Characterization of GaN Films Grown at Low and High Temperatures / C.H. Yan, H.W. Yao, J.M. Van Hove, A.M. Wowchak, P.P. Chow, J. Han, J.M. Zavada 313.".
catalog description "In Situ Spectroscopic Ellipsometry for the Real Time Process Control of Plasma Etching of Silicon Nitride / I.G. Rosen, T. Parent, B. Fidan, A. Madhukar 263 -- Characterization of Ni- and Ni(Pt)-Silicide Formation on Narrow Polycrystalline Si Lines by Raman Spectroscopy / P.S. Lee, D. Mangelinck, K.L. Pey, J. Ding, T. Osipowicz, C.S. Ho, G.L. Chen, L. Chan 269 -- Raman Characterization of Composition and Strain in Si[subscript 1-x]Ge[subscript x]/Si Heterostructures / Ran Liu, B. Tillack, P. Zaumseil 277 -- Nondestructive Measurement of In-Plane Residual Stress in Silicon Strips / Tieyu Zheng, Steven Danyluk 283 -- Characterization of Copper Surfaces Used in Electronic Circuit Boards by Reflectance FT-IR / James M. Sloan, Charles G. Pergantis 289 -- In Situ Spectroscopic Ellipsometry Study of the Oxide Etching and Surface Damaging Processes on Silicon Under Hydrogen Plasma / I.M. Vargas, J.Y. Manso, J.R. Guzman, B.R. Weiner, G. Morell 295 --".
catalog description "Includes bibliographical references and index.".
catalog description "Infrared Evaluation of Heat Generation During the Cyclic Deformation of a Cellular Al Alloy / A. Rabiei, J.W. Hutchinson, A.G. Evans 135 -- Microscopic Techniques for Characterization of Magnetic Layers / N. Meyendorf, I. Altpeter, U. Netzelmann, J. Hoffmann, W. Nichtl-Pecher, H. Grimm 145 -- Giant Magnetoresistance Imaging for NDE of Conductive Materials / E.S. Boltz, S.G. Albanna, A.R. Stallings, Y.H. Spooner, J.P. Abeyta 151 -- Non-Destructive Evaluation of Mechanical Properties of Magnetic Materials / Kevin P. Kankolenski, Susan Z. Hua, David X. Yang, G.E. Hicho, L.J. Swartzendruber, Z. Zang, Harsh Deep Chopra 157 -- Non-Destructive Evaluation of 304 Stainless Steels Using a Scanning Hall-Sensor Microscope: Visualization of Strain-Induced Austenite-Phase Breakdown / A. Oota, K. Miyake, D. Sugiyama, H. Aoki, 163 --".
catalog description "Materials Research Society Symposium Proceedings xiv -- Process Control and Deformation Behavior VIA X-ray Techniques -- Optimization of X-ray Techniques for Nondestructive Characterization of Single Crystal Turbine Blades / J.M. Winter, Jr., K.G. Lipetzky, R.E. Green, Jr. 3 -- In Situ Observation of Oxidization Process at the Most Upper Surfaces by X-ray Surface Propagation Waves / Toshihisa Horiuchi, Kenji Ishida, Kazumi Matsushige 15 -- Three-Dimensional, Nondestructive Imaging of Low Density Materials / J.H. Kinney, D.L. Haup, J.D. Lemay 19 -- Image-Guided Failure Assessment of Porous Materials / M. Tantillo, R. Muller 25 -- X-ray Microtomography of Fatigue Crack Closure as a Function of Applied Load In Al-Li 2090 T8E41 Samples / R. Morano, S.R. Stock, G.R. Davis, J.C. Elliott 31 -- Interfacial Diffusion in a MOCVD Grown Barium Titanate Film / A. Datta, Soma Chattopadhyay, A.G. Richter, J. Kmetko, C.B. Lee 37 --".
catalog description "Method and Instrumentation for Nondestructive Characterization of Surface Area and Pore Size Distribution of Thin Films in Their Deposited State / E.S. Boltz, Y.H. Spooner, S.G. Albanna, D.J. Taylor, A.R. Stallings, J.P. Abeyta 231 -- Experimental Simulation of Contamination Arising From Electro Rocket Engine-Jet on Surface of Spacecraft Units / A. Chirov, A. Nadiradze, V. Shaposhnikov, V. Egorov 237 -- Thermal Penetration Times as a Nondestructive Measure of Orientation in Polyimide Film / C. Chandler, N.E. Mathis, R.J. Samuels 243 -- Photoelastic Imaging of Process Induced Defects in 300mm-Silicon Wafers / H.D. Geiler, W. Kurner, O. Storbeck 249 -- IRS and ESR Characterizations of Nanocomposite Thin Films Derived From Alkanethiolates and Gold Nanoparticles / W.X. Zheng, F.L. Leibowitz, M.M. Maye, D.C. Gilbert, D.C. Doetschman, C.J. Zhong 255 -- Optical and Infrared Techniques --".
catalog description "Yutaka Majima, Yutaka Oyama, Mitsumasa Iwamoto 201 -- Characterization of Nitrided Silicon-Silicon Dioxide Interfaces / M.L. Polignano, M. Alessandri, D. Brazzelli, B. Crivelli, G. Ghidini, R. Zonca, A.P. Caricato, M. Bersani, M. Sbetti, L. Vanzetti, G.C. Xing, G.E. Miner, N. Astici, S. Kuppurao, D. Lopes 207 -- IR Tomography of the Lifetime and Diffusion Length of Charge Carriers in Semiconductor Silicon Ingots / V.D. Akhmetov, N.V. Fateev 213 -- Monitoring Silicon Quality From Diffusion Furnaces Using In-Line Measurements / Matt Stoker, Kelvin Catmull, Greg Horner, Brian Letherer 219 -- Small Signal AC-Surface Photovoltage Technique for Non-Contact Monitoring of Near Surface Doping and Recombination-Generation in the Depletion Layer / D. Marinskiy, J. Lagowski, M. Wilson, A. Savtchouk, L. Jastrzebski, D. DeBusk 225 --".
catalog extent "xiii, 322 p. :".
catalog hasFormat "Nondestructive methods for materials characterization.".
catalog identifier "1558994998".
catalog isFormatOf "Nondestructive methods for materials characterization.".
catalog isPartOf "Materials Research Society symposia proceedings ; v. 591.".
catalog isPartOf "Materials Research Society symposium proceedings ; v. 591".
catalog issued "2000".
catalog issued "c2000.".
catalog language "eng".
catalog publisher "Warrendale, Pa. : Materials Research Society,".
catalog relation "Nondestructive methods for materials characterization.".
catalog subject "620.1/127 21".
catalog subject "Materials Testing Congresses.".
catalog subject "Nondestructive testing Congresses.".
catalog subject "TA417.2 .N67247 2000".
catalog subject "TA417.2. N67247 2000".
catalog tableOfContents "Dual Band Infrared Thermography as a NDT Tool for the Characterization of the Building Materials and Conservation Performance in Historic Structures / A. Moropoulou, N.P. Avdelidis, M. Koui, N.K. Kanellopoulos 169 -- Characterization of Hydrogen in Concrete by Cold Neutron Prompt Gamma-Ray Activation Analysis and Neutron Incoherent Scattering / Rick L. Paul, H. Heatherr Chen-Mayer, Richard M. Lindstrom, Menno Blaauw 175 -- NDE For Silicon Wafers and Thin Films -- Quantitative Contact Spectroscopy and Imaging by Atomic-Force Acoustic Microscopy / W. Arnold, S. Amelio, S. Hirsekorn, U. Rabe 183 -- Precise Determination of Thin Metal Film Thickness With Laser-Induced Acoustic Grating Technique / A.A. Maznev, M.J. Banet, M. Gostein, R.B. Hanselman, M.A. Joffe, R. Sacco, K.A. Nelson 195 -- Quantitative Measurement of Local Carrier Concentration of Semiconductor From Displacement Current-Voltage Curve Using a Scanning Vibrating Tip /".
catalog tableOfContents "High-Frequency Stroboscopic X-ray Topography Under Surface Acoustic Wave Excitation / E. Zolotoyabko 47 -- NDE for Fracture Fatigue and Corrosion -- Scanning Acoustic Microscopy and X-ray Diffraction Investigation of Near Crack Tip Stresses / S. Sathish, R.W. Martin 55 -- Development of Nondestructive Method for Prediction of Crack Instability / J.L. Schroeder, D. Eylon, E.B. Shell, T.E. Matikas 61 -- Nondestructive Characterization of Corrosion Protective Coatings on Aluminum Alloy Substrates / J. Hoffmann, S. Sathish, M. Khobaib, N. Meyendorf, U. Netzelmann, T.E. Matikas 67 -- Nondestructive Evaluation of Fatigue in Titanium Alloys / H. Rosner, N. Meyendorf, S. Sathish, T.E. Matikas 73 -- Real-Time Monitoring of Acoustic Linear and Nonlinear Behavior of Titanium Alloys During Cyclic Loading / J. Frouin, J. Maurer, S. Sathish, D. Eylon, J.K. Na, T.E. Matikas 79 -- Electric and Dielectric NDE --".
catalog tableOfContents "Impedance Spectroscopy Investigation on the Low-Temperature Degradation of Tetragonal Zirconia: Influence of Measurement Conditions / A.P. Santos, R.Z. Domingues 87 -- Electrically Based Non-Destructive Microstructural Characterization of All Classes of Materials / Rosario A. Gerhardt 93 -- Non-Destructive Dielectric Assessment of Water Permeation in Composite Structures / P. Boinard, E. Boinard, R.A. Pethrick, W.M. Banks, R.L. Crane 105 -- Nondestructive Damage Evaluation of Electro-Mechanical Components Using a Hybrid, Computational and Experimental Approach / C. Furlong, R.J. Pryputniewicz 111 -- Structure-Sensitive Properties for NDE Characterization -- Role of Structure-to-Property-Relationships in Materials Characterization / W. Morgner 119 -- Nonlinear Ultrasonic Parameter in Precipitate-Hardened Steels / D.C. Hurley, D. Balzar, P.T. Purtscher 129 --".
catalog tableOfContents "In Situ Monitoring of MOCVD of Aluminum Nitride by Optical Spectroscopies / S.C. Allen, H.H. Richardson 301 -- Real-Time Optical Characterization and Control of Heteroepitaxial Ga[subscript x]In[subscript 1-x]P Growth by P-Polarized Reflectance / N. Dietz, K. Ito, I. Lauko, V. Woods 307 -- Nondestructive Characterization of GaN Films Grown at Low and High Temperatures / C.H. Yan, H.W. Yao, J.M. Van Hove, A.M. Wowchak, P.P. Chow, J. Han, J.M. Zavada 313.".
catalog tableOfContents "In Situ Spectroscopic Ellipsometry for the Real Time Process Control of Plasma Etching of Silicon Nitride / I.G. Rosen, T. Parent, B. Fidan, A. Madhukar 263 -- Characterization of Ni- and Ni(Pt)-Silicide Formation on Narrow Polycrystalline Si Lines by Raman Spectroscopy / P.S. Lee, D. Mangelinck, K.L. Pey, J. Ding, T. Osipowicz, C.S. Ho, G.L. Chen, L. Chan 269 -- Raman Characterization of Composition and Strain in Si[subscript 1-x]Ge[subscript x]/Si Heterostructures / Ran Liu, B. Tillack, P. Zaumseil 277 -- Nondestructive Measurement of In-Plane Residual Stress in Silicon Strips / Tieyu Zheng, Steven Danyluk 283 -- Characterization of Copper Surfaces Used in Electronic Circuit Boards by Reflectance FT-IR / James M. Sloan, Charles G. Pergantis 289 -- In Situ Spectroscopic Ellipsometry Study of the Oxide Etching and Surface Damaging Processes on Silicon Under Hydrogen Plasma / I.M. Vargas, J.Y. Manso, J.R. Guzman, B.R. Weiner, G. Morell 295 --".
catalog tableOfContents "Infrared Evaluation of Heat Generation During the Cyclic Deformation of a Cellular Al Alloy / A. Rabiei, J.W. Hutchinson, A.G. Evans 135 -- Microscopic Techniques for Characterization of Magnetic Layers / N. Meyendorf, I. Altpeter, U. Netzelmann, J. Hoffmann, W. Nichtl-Pecher, H. Grimm 145 -- Giant Magnetoresistance Imaging for NDE of Conductive Materials / E.S. Boltz, S.G. Albanna, A.R. Stallings, Y.H. Spooner, J.P. Abeyta 151 -- Non-Destructive Evaluation of Mechanical Properties of Magnetic Materials / Kevin P. Kankolenski, Susan Z. Hua, David X. Yang, G.E. Hicho, L.J. Swartzendruber, Z. Zang, Harsh Deep Chopra 157 -- Non-Destructive Evaluation of 304 Stainless Steels Using a Scanning Hall-Sensor Microscope: Visualization of Strain-Induced Austenite-Phase Breakdown / A. Oota, K. Miyake, D. Sugiyama, H. Aoki, 163 --".
catalog tableOfContents "Materials Research Society Symposium Proceedings xiv -- Process Control and Deformation Behavior VIA X-ray Techniques -- Optimization of X-ray Techniques for Nondestructive Characterization of Single Crystal Turbine Blades / J.M. Winter, Jr., K.G. Lipetzky, R.E. Green, Jr. 3 -- In Situ Observation of Oxidization Process at the Most Upper Surfaces by X-ray Surface Propagation Waves / Toshihisa Horiuchi, Kenji Ishida, Kazumi Matsushige 15 -- Three-Dimensional, Nondestructive Imaging of Low Density Materials / J.H. Kinney, D.L. Haup, J.D. Lemay 19 -- Image-Guided Failure Assessment of Porous Materials / M. Tantillo, R. Muller 25 -- X-ray Microtomography of Fatigue Crack Closure as a Function of Applied Load In Al-Li 2090 T8E41 Samples / R. Morano, S.R. Stock, G.R. Davis, J.C. Elliott 31 -- Interfacial Diffusion in a MOCVD Grown Barium Titanate Film / A. Datta, Soma Chattopadhyay, A.G. Richter, J. Kmetko, C.B. Lee 37 --".
catalog tableOfContents "Method and Instrumentation for Nondestructive Characterization of Surface Area and Pore Size Distribution of Thin Films in Their Deposited State / E.S. Boltz, Y.H. Spooner, S.G. Albanna, D.J. Taylor, A.R. Stallings, J.P. Abeyta 231 -- Experimental Simulation of Contamination Arising From Electro Rocket Engine-Jet on Surface of Spacecraft Units / A. Chirov, A. Nadiradze, V. Shaposhnikov, V. Egorov 237 -- Thermal Penetration Times as a Nondestructive Measure of Orientation in Polyimide Film / C. Chandler, N.E. Mathis, R.J. Samuels 243 -- Photoelastic Imaging of Process Induced Defects in 300mm-Silicon Wafers / H.D. Geiler, W. Kurner, O. Storbeck 249 -- IRS and ESR Characterizations of Nanocomposite Thin Films Derived From Alkanethiolates and Gold Nanoparticles / W.X. Zheng, F.L. Leibowitz, M.M. Maye, D.C. Gilbert, D.C. Doetschman, C.J. Zhong 255 -- Optical and Infrared Techniques --".
catalog tableOfContents "Yutaka Majima, Yutaka Oyama, Mitsumasa Iwamoto 201 -- Characterization of Nitrided Silicon-Silicon Dioxide Interfaces / M.L. Polignano, M. Alessandri, D. Brazzelli, B. Crivelli, G. Ghidini, R. Zonca, A.P. Caricato, M. Bersani, M. Sbetti, L. Vanzetti, G.C. Xing, G.E. Miner, N. Astici, S. Kuppurao, D. Lopes 207 -- IR Tomography of the Lifetime and Diffusion Length of Charge Carriers in Semiconductor Silicon Ingots / V.D. Akhmetov, N.V. Fateev 213 -- Monitoring Silicon Quality From Diffusion Furnaces Using In-Line Measurements / Matt Stoker, Kelvin Catmull, Greg Horner, Brian Letherer 219 -- Small Signal AC-Surface Photovoltage Technique for Non-Contact Monitoring of Near Surface Doping and Recombination-Generation in the Depletion Layer / D. Marinskiy, J. Lagowski, M. Wilson, A. Savtchouk, L. Jastrzebski, D. DeBusk 225 --".
catalog title "Nondestructive methods for materials characterization / editors, George Y. Baaklini ... [et al.].".
catalog type "Conference proceedings. fast".
catalog type "text".