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- catalog abstract "With a tutorial approach, this book covers the most impor- tant aspects of the scattering of electromagnetic radiation from structures (isolated or on a substrate) whose size is comparable to the incident wavelength. Special emphasis is placed on the electromagnetic problem of microstructures lo- cated close to an interface by reviewing the most important numerical methods for calculating the scattered field. The polarization propagation and the statistics of scattered in- tensity in microstructured targets are also presented from a didactic point of view. The final part of the book is dedi- cated to the most significant applications in both basic and applied research: surface enhanced Raman scattering, monito- ring and detection of surface contamination by particles, optical communications, particle sizing and others.".
- catalog contributor b11682992.
- catalog contributor b11682993.
- catalog contributor b11682994.
- catalog created "2000.".
- catalog date "2000".
- catalog date "2000.".
- catalog dateCopyrighted "2000.".
- catalog description "Includes bibliographical references.".
- catalog description "Introduction -- I. Theory -- II. Scattering by Particles on Substrates - Numerical Methods -- III. Scattering of Polarized Light -- IV. Statistics of the Scattered Light -- V. Applications.".
- catalog description "With a tutorial approach, this book covers the most impor- tant aspects of the scattering of electromagnetic radiation from structures (isolated or on a substrate) whose size is comparable to the incident wavelength. Special emphasis is placed on the electromagnetic problem of microstructures lo- cated close to an interface by reviewing the most important numerical methods for calculating the scattered field. The polarization propagation and the statistics of scattered in- tensity in microstructured targets are also presented from a didactic point of view. The final part of the book is dedi- cated to the most significant applications in both basic and applied research: surface enhanced Raman scattering, monito- ring and detection of surface contamination by particles, optical communications, particle sizing and others.".
- catalog extent "300 p. :".
- catalog identifier "354066937X (softcover : alk. paper)".
- catalog isPartOf "Lecture notes in physics".
- catalog issued "2000".
- catalog issued "2000.".
- catalog language "eng".
- catalog publisher "New York : Springer,".
- catalog subject "535/.43 21".
- catalog subject "Electromagnetism.".
- catalog subject "Light Scattering.".
- catalog subject "Materials.".
- catalog subject "Microstructure Optical properties.".
- catalog subject "Nanotechnology.".
- catalog subject "Particles (Nuclear physics).".
- catalog subject "QC427.4 .L527 2000".
- catalog tableOfContents "Introduction -- I. Theory -- II. Scattering by Particles on Substrates - Numerical Methods -- III. Scattering of Polarized Light -- IV. Statistics of the Scattered Light -- V. Applications.".
- catalog title "Light scattering from microstructures : lectures of the Summer School of Laredo, University of Cantabria, held at Laredo, Spain, Sept. 11-13, 1998 / Fernando Moreno, Francisco González (eds.).".
- catalog type "Laredo (1998) swd".
- catalog type "text".