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- catalog contributor b11827546.
- catalog contributor b11827547.
- catalog contributor b11827548.
- catalog created "[1999]".
- catalog date "1999".
- catalog date "[1999]".
- catalog dateCopyrighted "[1999]".
- catalog description "Includes bibliographical references (p. 18-20).".
- catalog extent "20 p. :".
- catalog isPartOf "NISTIR ; 6429".
- catalog issued "1999".
- catalog issued "[1999]".
- catalog language "eng".
- catalog publisher "Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,".
- catalog spatial "United States".
- catalog spatial "United States.".
- catalog subject "CAD/CAM systems Specifications United States.".
- catalog subject "CAD/CAM systems United States Testing.".
- catalog subject "Computer interfaces Specifications United States.".
- catalog subject "Computer interfaces United States Testing.".
- catalog title "Testability of product data management interfaces [microform] / David Flater, KC Morris.".
- catalog type "text".