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- catalog contributor b11830203.
- catalog contributor b11830204.
- catalog created "2000]".
- catalog date "2000".
- catalog date "2000]".
- catalog dateCopyrighted "2000]".
- catalog description "Includes bibliographical references (p. 38-39).".
- catalog extent "1 v. (various pagings) :".
- catalog isPartOf "NIST special publication ; 250-52".
- catalog isPartOf "NIST special publication. NIST measurement services".
- catalog issued "2000".
- catalog issued "2000]".
- catalog language "eng".
- catalog publisher "Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology ; [Washington, DC : For sale by the Supt. of Docs., U.S. G.P.O.,".
- catalog spatial "United States.".
- catalog subject "Capacitance meters Calibration.".
- catalog subject "Electric capacity Standards United States.".
- catalog title "Error analysis and calibration uncertainty of capacitance standards at NIST / Y. May Chang.".
- catalog type "text".