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- catalog contributor b11842252.
- catalog contributor b11842253.
- catalog created "1999]".
- catalog date "1999".
- catalog date "1999]".
- catalog dateCopyrighted "1999]".
- catalog extent "1 v.".
- catalog isPartOf "NASA technical paper ; 209264.".
- catalog isPartOf "NASA/TP ; 1999-209264".
- catalog issued "1999".
- catalog issued "1999]".
- catalog language "eng".
- catalog publisher "[Marshall Space Flight Center], Ala. : National Aeronautics and Space Administration, Marshall Space Flight Center ; [Springfield, Va. : National Technical Information Service, distributor,".
- catalog subject "Contamination (Technology)".
- catalog subject "Optical instruments.".
- catalog subject "Space vehicles Contamination.".
- catalog title "Contamination effects on EUV optics [microform] / J. Tveekrem.".
- catalog type "text".