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- catalog abstract "This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.".
- catalog contributor b11919561.
- catalog contributor b11919562.
- catalog contributor b11919563.
- catalog contributor b11919564.
- catalog created "c2000.".
- catalog date "2000".
- catalog date "c2000.".
- catalog dateCopyrighted "c2000.".
- catalog description "Includes bibliographical references and index.".
- catalog description "Invited Papers -- Pierre Devijver Lecture -- Hybrid and Combined Methods -- Applications -- Document Image Analysis -- Grammar and Language Methods -- Structural Matching -- Graph-Based Methods -- Shape Analysis -- SSPR Poster Session -- Clustering and Density Estimation -- Object Recognition -- General Methodology I -- General Methodology II -- Feature Extraction and Selection -- SPR Poster Session.".
- catalog description "This book constitutes the joint refereed proceedings of the 8th International Workshop on Structural and Syntactic Pattern Recognition and the 3rd International Workshop on Statistical Techniques in Pattern Recognition, SSPR 2000 and SPR 2000, held in Alicante, Spain in August/September 2000. The 52 revised full papers presented together with five invited papers and 35 posters were carefully reviewed and selected from a total of 130 submissions. The book offers topical sections on hybrid and combined methods, document image analysis, grammar and language methods, structural matching, graph-based methods, shape analysis, clustering and density estimation, object recognition, general methodology, and feature extraction and selection.".
- catalog extent "xviii, 901 p. :".
- catalog identifier "3540679464".
- catalog isPartOf "Lecture notes in computer science ; 1876".
- catalog issued "2000".
- catalog issued "c2000.".
- catalog language "eng".
- catalog publisher "Berlin ; New York : Springer,".
- catalog subject "006.4 21".
- catalog subject "Artificial intelligence.".
- catalog subject "Computer graphics.".
- catalog subject "Computer science.".
- catalog subject "Computer vision.".
- catalog subject "Optical pattern recognition.".
- catalog subject "Pattern recognition systems Congresses.".
- catalog subject "TK7882.P3 I57 2000".
- catalog tableOfContents "Invited Papers -- Pierre Devijver Lecture -- Hybrid and Combined Methods -- Applications -- Document Image Analysis -- Grammar and Language Methods -- Structural Matching -- Graph-Based Methods -- Shape Analysis -- SSPR Poster Session -- Clustering and Density Estimation -- Object Recognition -- General Methodology I -- General Methodology II -- Feature Extraction and Selection -- SPR Poster Session.".
- catalog title "Advances in pattern recognition: joint IAPR International Workshops SSPR'2000 and SPR 2000, Alicante, Spain, August 30-September 1, 2000 : proceedings / Francesc J. Ferri ... [et al.] (eds.).".
- catalog type "text".