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- catalog contributor b12019041.
- catalog contributor b12019042.
- catalog contributor b12019043.
- catalog contributor b12019044.
- catalog contributor b12019045.
- catalog created "c2000.".
- catalog date "2000".
- catalog date "c2000.".
- catalog dateCopyrighted "c2000.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xx, 268 p. :".
- catalog hasFormat "Instruments for optics and optoelectronic inspection and control.".
- catalog identifier "0819438944".
- catalog isFormatOf "Instruments for optics and optoelectronic inspection and control.".
- catalog isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4223.".
- catalog isPartOf "SPIE proceedings series ; v. 4223".
- catalog issued "2000".
- catalog issued "c2000.".
- catalog language "eng".
- catalog publisher "Bellingham, Wash., USA : SPIE,".
- catalog relation "Instruments for optics and optoelectronic inspection and control.".
- catalog subject "Detectors Industrial applications Congresses.".
- catalog subject "Integrated optics Congresses.".
- catalog subject "Optoelectronic devices Industrial applications Congresses.".
- catalog subject "Quality control Congresses.".
- catalog subject "TA1660 .I515 2000".
- catalog title "Instruments for optics and optoelectronic inspection and control : 8-10 November 2000, Beijing, China / Guang Hui Wei, Sheng Liu, chairs/editors ; sponsored by COEMA--China Optics & Optoelectronic Manufacturer's Association, Chinese Physical Society, [and] SPIE--the International Society for Optical Engineering.".
- catalog type "Conference proceedings. fast".
- catalog type "text".