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- catalog contributor b12195189.
- catalog contributor b12195190.
- catalog created "c2000.".
- catalog date "2000".
- catalog date "c2000.".
- catalog dateCopyrighted "c2000.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "viii, 314 p. :".
- catalog hasFormat "Optical devices and diagnostics in materials science.".
- catalog identifier "0819437433".
- catalog isFormatOf "Optical devices and diagnostics in materials science.".
- catalog isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4098.".
- catalog isPartOf "SPIE proceedings series ; v. 4098".
- catalog issued "2000".
- catalog issued "c2000.".
- catalog language "eng".
- catalog publisher "Bellingham, Wash., USA : SPIE,".
- catalog relation "Optical devices and diagnostics in materials science.".
- catalog subject "Diagnostic imaging Industrial applications Congresses.".
- catalog subject "Light Scattering Congresses.".
- catalog subject "Nanostructured materials Testing Congresses.".
- catalog subject "Near-field microscopy Industrial applications Congresses.".
- catalog subject "Optical materials Testing Congresses.".
- catalog subject "Optoelectronic devices Congresses.".
- catalog subject "Raman spectroscopy Industrial applications Congresses.".
- catalog subject "TA418.9.N35 O388 2000".
- catalog title "Optical devices and diagnostics in materials science : 1-4 August 2000, San Diego, USA / David L. Andrews ... [et al.] ; sponsored ... by SPIE--the International Society for Optical Engineering.".
- catalog type "text".