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- catalog contributor b12197796.
- catalog contributor b12197797.
- catalog contributor b12197798.
- catalog created "1999]".
- catalog date "1999".
- catalog date "1999]".
- catalog dateCopyrighted "1999]".
- catalog extent "1 v.".
- catalog isPartOf "NASA technical paper ; 209545.".
- catalog isPartOf "NASA/TP ; 1999-209545".
- catalog issued "1999".
- catalog issued "1999]".
- catalog language "eng".
- catalog publisher "Hampton, Va. : National Aeronautics and Space Administration, Langley Research Center ; [Springfield, Va. : National Technical Information Service, distributor,".
- catalog subject "Calibration.".
- catalog subject "Physical measurements.".
- catalog title "Uncertainty analysis of instrument calibration and application [microform] / John S. Tripp and Ping Tcheng.".
- catalog type "text".