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- catalog alternative "SEM performance measurement system".
- catalog alternative "Scanning electron microscope Sentinel".
- catalog alternative "Scanning electron microscope performance measurement system".
- catalog contributor b12197952.
- catalog contributor b12197953.
- catalog created "[2000-".
- catalog date "2000".
- catalog date "[2000-".
- catalog dateCopyrighted "[2000-".
- catalog description "Includes bibliographical references.".
- catalog description "Issued in parts.".
- catalog extent "v. :".
- catalog isPartOf "NISTIR".
- catalog issued "2000".
- catalog issued "[2000-".
- catalog language "eng".
- catalog publisher "Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, National Institute of Standards and Technology,".
- catalog subject "Scanning electron microscopes.".
- catalog subject "Semiconductor wafers Measurement.".
- catalog title "SEM Sentinel [microform] : SEM performance measurement system / Alice V. Ling ... [et al.].".
- catalog title "SEM performance measurement system".
- catalog title "Scanning electron microscope Sentinel".
- catalog title "Scanning electron microscope performance measurement system".
- catalog type "text".