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- catalog contributor b12251031.
- catalog contributor b12251032.
- catalog created "2001.".
- catalog date "2001".
- catalog date "2001.".
- catalog dateCopyrighted "2001.".
- catalog description "EBIS/T devices -- EBIS/T physics -- Electron and ion beam optics -- EBIS-based systems -- Applications -- Conclusion of the symposium.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xiv, 304 p. :".
- catalog identifier "0735400113".
- catalog isPartOf "AIP conference proceedings ; no. 572.".
- catalog isPartOf "AIP conference proceedings, 0094-243X ; v. 572".
- catalog issued "2001".
- catalog issued "2001.".
- catalog language "eng".
- catalog publisher "Melville, N.Y. : American Institute of Physics,".
- catalog subject "Electron beams Congresses.".
- catalog subject "Ion sources Congresses.".
- catalog subject "QC+".
- catalog tableOfContents "EBIS/T devices -- EBIS/T physics -- Electron and ion beam optics -- EBIS-based systems -- Applications -- Conclusion of the symposium.".
- catalog title "Electron beam ion sources and traps and their applications : 8th international symposium, EBIS/T 2000, Upton, New York, 5-8 November 2000 / editor, Krsto Prelec.".
- catalog type "Conference proceedings. fast".
- catalog type "text".