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catalog contributor b12286566.
catalog created "c2001.".
catalog date "2001".
catalog date "c2001.".
catalog dateCopyrighted "c2001.".
catalog description "Combined HRTEM and EFTEM Study of Precipitates in Tungsten and Chromium-Containing TiB[superscript 2] / W. Mader, B. Freitag, K. Kelm, R. Telle, C. Schmalzried 289 -- High Spatial Resolution X-ray Microanalysis of Radiation-Induced Segregation in Proton-Irradiated Stainless Steels / E.A. Kenik, J.T. Busby, G.S. Was 295 -- Investigation of Copper Segregation to the [Sigma]5(310)/[001] Symmetric Tilt Grain Boundary in Aluminum / Jurgen M. Plitzko, Geoffrey H. Campbell, Wayne E. King, Stephen M. Foiles 301 -- STEM Analysis of the Segregation of Bi to [Sigma]19a Grain Boundaries in Cu / W. Sigle, L-S. Chang, W. Gust, M. Ruhle 307 -- Investigating Atomic Scale Phenomena at Materials Interfaces With Correlated Techniques in STEM/TEM / N.D. Browning, A.W. Nicholls, E.M. James, I. Arslan, Y. Xin, K. Kishida, S. Stemmer 311 -- Atomic Scale Analysis of Cubic Zirconia Grain Boundaries / E.C. Dickey, X. Fan, M. Yong, S.B. Sinnott, S.J. Pennycook 323 --".
catalog description "Controlled Environment Transmission Electron Microscopy / I.M. Robertson 57 -- Analysis of the Atomic Scale Defect Chemistry in Oxygen Deficient Materials by STEM / Y. Ito, S. Stemmer, R.F. Klie, N.D. Browning, A. Sane, T.J. Mazanec 69 -- Energy Dispersive X-ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advanced in Materials Microanalysis / Dale Newbury, David Wollman, Kent Irwin, Gene Hilton, John Martinis 75 -- Surface Sensitivity Effects With Local Probe Scanning Auger-Scanning Electron Microscopy / D.T.L. van Agterveld, G. Palasantzas, J. Th. M. De Hosson 81 -- X-ray Elemental Mapping of Multi-Component Steels / Adam J. Papworth, David B. Williams 87 -- High Sensitivity Convergent Beam Electron Diffraction for the Determination of the Tetragonal Distortion of Epitaxial Films / C. Schuer, M. Leicht, T. Marek, H.P. Strunk 93 --".
catalog description "D.J. Norris, A.G. Cullis, T.J. Grasby, E.H.C. Parker 167 -- Atomic-Scale Imaging of Dopant Atom Distributions Within Silicon [delta]-Doped Layers / R. Vanfleet, D.A. Muller, H.J. Gossmann, P.H. Citrin, J. Silcoxe 173 -- In Situ Annealing Transmission Electron Microscopy Study of Pd/Ge/Pd/GaAs Interfacial Reactions / F. Radulescu, J.M. McCarthy, E.A. Stach 179 -- Incoherent High-Resolution Z-Contrast Imaging of Silicon and Gallium Arsenide Using HAADF-STEM / Y. Kotaka, T. Yamazaki, Y. Kikuchi, K. Watanabe 185 -- Atomic Structure of Mosaic Grain Boundary Dislocations in GaN Epitaxial Layers / V. Potin, G. Nouet, P. Ruterana, R.C. Pond 191 -- Interface Structure and Zn Diffusion in the CdTe/ZnTe/Si System Grown by MBE / S-C.Y. Tsen, David J. Smith, P.A. Crozier, S. Rujirawat, G. Brill, S. Sivananthan 197 --".
catalog description "Determination of Coherency Strain Fields Around Coherent Particles in Ni-Al Alloys by HREM and CBED / H.A. Calderon, L. Calzado, C. Kisielowski, C.Y. Wang, R. Kilaas 99 -- An Electron Microscope Study of Diffusion Assisted Dislocation Processes in Intermetallic Gamma TiAl / F. Appel, U. Lorenz, M. Oehring 105 -- Specimen Current Imaging of Delamination in Ceramic Films on Metal Substrates in the SEM / S. Rangarajan, A.H. King 111 -- In Situ Observation of Melting and Solidification / H. Saka, S. Arai, S. Muto, H. Miyai, S. Tsukimoto 117 -- Site Occupancy Determination by ALCHEMI of Nb and Cr in [gamma]-TiAl and Their Effects on the [alpha] to [gamma] Massive Phase Transformation / T.M. Miller, L. Wang, W.H. Hofmeister, J.E. Wittig, I.M. Anderson 123 -- Electron Channeling X-ray Microanalysis for Cation Configuration in Irradiated Magnesium Aluminate Spinel / S. Matsumura, T. Soeda, N.J. Zaluzec, C. Kinoshita 129 --".
catalog description "In Situ Study of Zirconia Stabilization by Anion Exchange (N for O) Using High-Temperature, Controlled Atmosphere Electron Diffraction / Renu Sharma, Eberhard Schweda, Dirk Naedele 135 -- Environmental Scanning Electron Microscopy as a Tool to Study Shrinkage Microcracks in Cement-Based Materials / J. Bisschop, J.G.M. van Mier 141 -- Microcharacterization of Heterogeneous Specimens Containing Tire Dust / Marina Camatini, Gaia M. Corbetta, Giovanni F. Crosta, Tigran Dolukhanyan, Giampaolo Giuliani, Changmo Sung 147 -- Microelectronic Materials -- Experimental Methods and Data Analysis for Fluctuation Microscopy / P.M. Voyles, M.M.J. Treacy, J.M. Gibson, H-C. Jin, J.R. Abelson 155 -- Microdiffraction, EDS, and HREM Investigation for Phase Identification With the Electron Microscope / P. Ruterana, A. Redjaimia 161 -- Energy-Loss Filtered Imaging of Segregation-Induced Interface Broadening in SiGe/Si p-Channel MOSFET Device Structures /".
catalog description "Includes bibliographical references and index.".
catalog description "J. Gazda, J. Zhao, P. Smith, R.A. White 365 -- Effects of "As Deposited" and Alloying Temperatures on the Distribution of Cu in 0.5%Cu-Al Films / P.L. Smith, J. Gazda 371 -- Interfacial Interaction Between Cr Thin Films and Oxide Glasses / N. Jiang, J. Silcox 377 -- Characterization of Intergranular Phases in Doped Zirconia Polycrystals / N.D. Evans, P.H. Imamura, J. Bentley, M.L. Mecartney 383 -- Effect of Different Oxidizing Atmospheres on the Initial Kinetics of Copper Oxidation as Studied In Situ UHV-TEM / Mridula D. Bharadwaj, Anu Gupta, J. Murray Gibson, Judith C. Yang 389 -- Bonding in Ion-Implanted Carbon Films Characterized by TEM Spectrum Lines and Energy-Filtered Imaging / J. Bentley, K.C. Walter, N.D. Evans 395.".
catalog description "Materials Research Society Symposium Proceedings xiv -- Magnetic Materials -- Microstructural Characterization of Longitudinal Magnetic Recording Media / Robert Sinclair, Dong-Won Park, Claus Habermeier, Kai Ma 3 -- Electron Holography of Nanostructured Magnetic Materials / R.E. Dunin-Borkowski, B. Kardynal, M.R. McCartney, M.R. Scheinfein, David J. Smith 13 -- Flux Mapping and Magnetic Behavior of Grain Boundaries in Nd-Fe-B Magnets / V.V. Volkov, Yimei Zhu 19 -- Crystallography and Defects -- LEEM Investigations of bcc Metals Grown Heteroepitaxially on Sapphire / W. Swiech, M. Ondrejeck, R.S. Appleton, C.S. Durfee, M. Mundschau, C.P. Flynn 27 -- Electron Backscatter Diffraction: A Powerful Tool for Phase Identification in the SEM / J.R. Michael, R.P. Goehner 39 -- Measuring the Thin Film Strain Tensor Near Aluminum Grain Boundaries via a New Image Processing Approach to CBED HOLZ Patterns / J. Inoue, A.F. Schwartzman, L.B. Freund 51 --".
catalog description "Relationship Between Structure and Luminescent Properties of Epitaxial Grown Y[superscript 2]O[superscript 3]:Eu Thin Films on LaAlO[superscript 3] Substrates / H-J. Gao, G. Duscher, X.D. Fan, S.J. Pennycook, D. Kumar, K.G. Cho, P.H. Holloway, R.K. Singh 203 -- Partially Ordered and Nanophase Materials -- Imaging Heterophase Molecular Materials in the Environmental SEM / B.L. Thiel, A.M. Donald, D.J. Stokes, I.C. Bache, N. Stelmashenko 211 -- A New Approach Towards Property Nanomeasurements Using In Situ TEM / Z.L. Wang, P. Poncharal, W.A. de Heer, R.P. Gao 217 -- Electron Microscopy of Single Molecules / D.E. Luzzi, B.W. Smith 223 -- Nanocrystal Thickness Information From Z-STEM: 3-D Imaging in One Shot / A.V. Kadavanich, T. Kippeny, M. Erwin, S.J. Rosenthal, S.J. Pennycook 229 -- Epitaxy and Atomic Structure Determination of Au/TiO[superscript 2] Interfaces by Combined EBSD and HRTEM / F. Cosandey, P. Stadelmann 235 --".
catalog description "SEM/EDX Spectrum Imaging and Statistical Analysis of a Metal/Ceramic Braze / Paul G. Kotula, Michael R. Keenan, Ian M. Anderson 329 -- Characterization of the Interface Between Lanthanum Hexa-Aluminate and Sapphire by Exit Wave Reconstruction / B. Wessler, A. Steinecker, W. Mader 335 -- Atomic and Electronic Structure Analysis of [Sigma]=3, 9 and 27 Boundary, and Multiple Junction in [beta]-SiC / K. Tanaka, M. Kohyama 341 -- Electronic Effects on Grain Boundary Structure in bcc Metals /e Geoffrey H. Campbell, Wayne E. King, James Belak, John A. Moriarty, Stephen M. Foiles 347 -- Structural Study of a [100] 45[degree] Twist Plus 7.5[degree] Tilt Grain Boundary in Aluminium by HREM / M. Shamsuzzoha, P.A. Deymier, David J. Smith 353 -- Atomic Structure of Gold and Copper Boundaries / C.J.D. Hetherington 359 -- Formation of AlN Films on Ti/TiN Arc-Layer Interface With Al-0.5%Cu Interconnects Evaluated by XPS and Energy-Filtered-TEM /".
catalog description "Theoretical Explanation of Pt Trimers Observed by Z-Contrast STEM / Karl Sohlberg, Sokrates T. Pantelides, Stephen J. Pennycook 241 -- Ion-Implanted Amorphous Silicon Studied by Variable Coherence TEM / J-Y. Cheng, J.M. Gibson, P.M. Voyles, M.M.J. Treacy, D.C. Jacobson 247 -- Analytical High-Resolution TEM Study on Au/TiO[superscript 2] Catalysts / T. Akita, K. Tanaka, S. Tsubota, M. Haruta 253 -- High-Resolution Scanning Electron Microscopy and Microanalysis of Supported Metal Catalysts / Jingyue Liu 259 -- On-Particle EDS Analysis of Bimetallic, Carbon-Supported Catalysts / Deborah L. Boxall, Edward A. Kenik, Charles M. Lukehart 265 -- Interfaces in Metals and Ceramics -- Structure Refinement of S-Phase Precipitates in Al-Cu-Mg Alloys by Quantitative HRTEM / R. Kilaas, V. Radmilovic, U. Dahmen 273 -- Quantitative Mapping of Concentrations and Bonding States by Energy Filtering TEM / J. Mayer, J.M. Plitzko 279 --".
catalog extent "xiii, 406 p. :".
catalog hasFormat "Advances in materials problem solving with the electron microscope.".
catalog identifier "1558994971".
catalog isFormatOf "Advances in materials problem solving with the electron microscope.".
catalog isPartOf "Materials Research Society symposia proceedings ; v. 589.".
catalog isPartOf "Materials Research Society symposium proceedings ; v. 589".
catalog issued "2001".
catalog issued "c2001.".
catalog language "eng".
catalog publisher "Warrendale, PA : Materials Research Society,".
catalog relation "Advances in materials problem solving with the electron microscope.".
catalog subject "620.1/1299 21".
catalog subject "Electron microscopy Congresses.".
catalog subject "Materials Microscopy Congresses.".
catalog subject "TA417.23 .A39 2001".
catalog tableOfContents "Combined HRTEM and EFTEM Study of Precipitates in Tungsten and Chromium-Containing TiB[superscript 2] / W. Mader, B. Freitag, K. Kelm, R. Telle, C. Schmalzried 289 -- High Spatial Resolution X-ray Microanalysis of Radiation-Induced Segregation in Proton-Irradiated Stainless Steels / E.A. Kenik, J.T. Busby, G.S. Was 295 -- Investigation of Copper Segregation to the [Sigma]5(310)/[001] Symmetric Tilt Grain Boundary in Aluminum / Jurgen M. Plitzko, Geoffrey H. Campbell, Wayne E. King, Stephen M. Foiles 301 -- STEM Analysis of the Segregation of Bi to [Sigma]19a Grain Boundaries in Cu / W. Sigle, L-S. Chang, W. Gust, M. Ruhle 307 -- Investigating Atomic Scale Phenomena at Materials Interfaces With Correlated Techniques in STEM/TEM / N.D. Browning, A.W. Nicholls, E.M. James, I. Arslan, Y. Xin, K. Kishida, S. Stemmer 311 -- Atomic Scale Analysis of Cubic Zirconia Grain Boundaries / E.C. Dickey, X. Fan, M. Yong, S.B. Sinnott, S.J. Pennycook 323 --".
catalog tableOfContents "Controlled Environment Transmission Electron Microscopy / I.M. Robertson 57 -- Analysis of the Atomic Scale Defect Chemistry in Oxygen Deficient Materials by STEM / Y. Ito, S. Stemmer, R.F. Klie, N.D. Browning, A. Sane, T.J. Mazanec 69 -- Energy Dispersive X-ray Spectrometry With the Transition Edge Sensor Microcalorimeter: A Revolutionary Advanced in Materials Microanalysis / Dale Newbury, David Wollman, Kent Irwin, Gene Hilton, John Martinis 75 -- Surface Sensitivity Effects With Local Probe Scanning Auger-Scanning Electron Microscopy / D.T.L. van Agterveld, G. Palasantzas, J. Th. M. De Hosson 81 -- X-ray Elemental Mapping of Multi-Component Steels / Adam J. Papworth, David B. Williams 87 -- High Sensitivity Convergent Beam Electron Diffraction for the Determination of the Tetragonal Distortion of Epitaxial Films / C. Schuer, M. Leicht, T. Marek, H.P. Strunk 93 --".
catalog tableOfContents "D.J. Norris, A.G. Cullis, T.J. Grasby, E.H.C. Parker 167 -- Atomic-Scale Imaging of Dopant Atom Distributions Within Silicon [delta]-Doped Layers / R. Vanfleet, D.A. Muller, H.J. Gossmann, P.H. Citrin, J. Silcoxe 173 -- In Situ Annealing Transmission Electron Microscopy Study of Pd/Ge/Pd/GaAs Interfacial Reactions / F. Radulescu, J.M. McCarthy, E.A. Stach 179 -- Incoherent High-Resolution Z-Contrast Imaging of Silicon and Gallium Arsenide Using HAADF-STEM / Y. Kotaka, T. Yamazaki, Y. Kikuchi, K. Watanabe 185 -- Atomic Structure of Mosaic Grain Boundary Dislocations in GaN Epitaxial Layers / V. Potin, G. Nouet, P. Ruterana, R.C. Pond 191 -- Interface Structure and Zn Diffusion in the CdTe/ZnTe/Si System Grown by MBE / S-C.Y. Tsen, David J. Smith, P.A. Crozier, S. Rujirawat, G. Brill, S. Sivananthan 197 --".
catalog tableOfContents "Determination of Coherency Strain Fields Around Coherent Particles in Ni-Al Alloys by HREM and CBED / H.A. Calderon, L. Calzado, C. Kisielowski, C.Y. Wang, R. Kilaas 99 -- An Electron Microscope Study of Diffusion Assisted Dislocation Processes in Intermetallic Gamma TiAl / F. Appel, U. Lorenz, M. Oehring 105 -- Specimen Current Imaging of Delamination in Ceramic Films on Metal Substrates in the SEM / S. Rangarajan, A.H. King 111 -- In Situ Observation of Melting and Solidification / H. Saka, S. Arai, S. Muto, H. Miyai, S. Tsukimoto 117 -- Site Occupancy Determination by ALCHEMI of Nb and Cr in [gamma]-TiAl and Their Effects on the [alpha] to [gamma] Massive Phase Transformation / T.M. Miller, L. Wang, W.H. Hofmeister, J.E. Wittig, I.M. Anderson 123 -- Electron Channeling X-ray Microanalysis for Cation Configuration in Irradiated Magnesium Aluminate Spinel / S. Matsumura, T. Soeda, N.J. Zaluzec, C. Kinoshita 129 --".
catalog tableOfContents "In Situ Study of Zirconia Stabilization by Anion Exchange (N for O) Using High-Temperature, Controlled Atmosphere Electron Diffraction / Renu Sharma, Eberhard Schweda, Dirk Naedele 135 -- Environmental Scanning Electron Microscopy as a Tool to Study Shrinkage Microcracks in Cement-Based Materials / J. Bisschop, J.G.M. van Mier 141 -- Microcharacterization of Heterogeneous Specimens Containing Tire Dust / Marina Camatini, Gaia M. Corbetta, Giovanni F. Crosta, Tigran Dolukhanyan, Giampaolo Giuliani, Changmo Sung 147 -- Microelectronic Materials -- Experimental Methods and Data Analysis for Fluctuation Microscopy / P.M. Voyles, M.M.J. Treacy, J.M. Gibson, H-C. Jin, J.R. Abelson 155 -- Microdiffraction, EDS, and HREM Investigation for Phase Identification With the Electron Microscope / P. Ruterana, A. Redjaimia 161 -- Energy-Loss Filtered Imaging of Segregation-Induced Interface Broadening in SiGe/Si p-Channel MOSFET Device Structures /".
catalog tableOfContents "J. Gazda, J. Zhao, P. Smith, R.A. White 365 -- Effects of "As Deposited" and Alloying Temperatures on the Distribution of Cu in 0.5%Cu-Al Films / P.L. Smith, J. Gazda 371 -- Interfacial Interaction Between Cr Thin Films and Oxide Glasses / N. Jiang, J. Silcox 377 -- Characterization of Intergranular Phases in Doped Zirconia Polycrystals / N.D. Evans, P.H. Imamura, J. Bentley, M.L. Mecartney 383 -- Effect of Different Oxidizing Atmospheres on the Initial Kinetics of Copper Oxidation as Studied In Situ UHV-TEM / Mridula D. Bharadwaj, Anu Gupta, J. Murray Gibson, Judith C. Yang 389 -- Bonding in Ion-Implanted Carbon Films Characterized by TEM Spectrum Lines and Energy-Filtered Imaging / J. Bentley, K.C. Walter, N.D. Evans 395.".
catalog tableOfContents "Materials Research Society Symposium Proceedings xiv -- Magnetic Materials -- Microstructural Characterization of Longitudinal Magnetic Recording Media / Robert Sinclair, Dong-Won Park, Claus Habermeier, Kai Ma 3 -- Electron Holography of Nanostructured Magnetic Materials / R.E. Dunin-Borkowski, B. Kardynal, M.R. McCartney, M.R. Scheinfein, David J. Smith 13 -- Flux Mapping and Magnetic Behavior of Grain Boundaries in Nd-Fe-B Magnets / V.V. Volkov, Yimei Zhu 19 -- Crystallography and Defects -- LEEM Investigations of bcc Metals Grown Heteroepitaxially on Sapphire / W. Swiech, M. Ondrejeck, R.S. Appleton, C.S. Durfee, M. Mundschau, C.P. Flynn 27 -- Electron Backscatter Diffraction: A Powerful Tool for Phase Identification in the SEM / J.R. Michael, R.P. Goehner 39 -- Measuring the Thin Film Strain Tensor Near Aluminum Grain Boundaries via a New Image Processing Approach to CBED HOLZ Patterns / J. Inoue, A.F. Schwartzman, L.B. Freund 51 --".
catalog tableOfContents "Relationship Between Structure and Luminescent Properties of Epitaxial Grown Y[superscript 2]O[superscript 3]:Eu Thin Films on LaAlO[superscript 3] Substrates / H-J. Gao, G. Duscher, X.D. Fan, S.J. Pennycook, D. Kumar, K.G. Cho, P.H. Holloway, R.K. Singh 203 -- Partially Ordered and Nanophase Materials -- Imaging Heterophase Molecular Materials in the Environmental SEM / B.L. Thiel, A.M. Donald, D.J. Stokes, I.C. Bache, N. Stelmashenko 211 -- A New Approach Towards Property Nanomeasurements Using In Situ TEM / Z.L. Wang, P. Poncharal, W.A. de Heer, R.P. Gao 217 -- Electron Microscopy of Single Molecules / D.E. Luzzi, B.W. Smith 223 -- Nanocrystal Thickness Information From Z-STEM: 3-D Imaging in One Shot / A.V. Kadavanich, T. Kippeny, M. Erwin, S.J. Rosenthal, S.J. Pennycook 229 -- Epitaxy and Atomic Structure Determination of Au/TiO[superscript 2] Interfaces by Combined EBSD and HRTEM / F. Cosandey, P. Stadelmann 235 --".
catalog tableOfContents "SEM/EDX Spectrum Imaging and Statistical Analysis of a Metal/Ceramic Braze / Paul G. Kotula, Michael R. Keenan, Ian M. Anderson 329 -- Characterization of the Interface Between Lanthanum Hexa-Aluminate and Sapphire by Exit Wave Reconstruction / B. Wessler, A. Steinecker, W. Mader 335 -- Atomic and Electronic Structure Analysis of [Sigma]=3, 9 and 27 Boundary, and Multiple Junction in [beta]-SiC / K. Tanaka, M. Kohyama 341 -- Electronic Effects on Grain Boundary Structure in bcc Metals /e Geoffrey H. Campbell, Wayne E. King, James Belak, John A. Moriarty, Stephen M. Foiles 347 -- Structural Study of a [100] 45[degree] Twist Plus 7.5[degree] Tilt Grain Boundary in Aluminium by HREM / M. Shamsuzzoha, P.A. Deymier, David J. Smith 353 -- Atomic Structure of Gold and Copper Boundaries / C.J.D. Hetherington 359 -- Formation of AlN Films on Ti/TiN Arc-Layer Interface With Al-0.5%Cu Interconnects Evaluated by XPS and Energy-Filtered-TEM /".
catalog tableOfContents "Theoretical Explanation of Pt Trimers Observed by Z-Contrast STEM / Karl Sohlberg, Sokrates T. Pantelides, Stephen J. Pennycook 241 -- Ion-Implanted Amorphous Silicon Studied by Variable Coherence TEM / J-Y. Cheng, J.M. Gibson, P.M. Voyles, M.M.J. Treacy, D.C. Jacobson 247 -- Analytical High-Resolution TEM Study on Au/TiO[superscript 2] Catalysts / T. Akita, K. Tanaka, S. Tsubota, M. Haruta 253 -- High-Resolution Scanning Electron Microscopy and Microanalysis of Supported Metal Catalysts / Jingyue Liu 259 -- On-Particle EDS Analysis of Bimetallic, Carbon-Supported Catalysts / Deborah L. Boxall, Edward A. Kenik, Charles M. Lukehart 265 -- Interfaces in Metals and Ceramics -- Structure Refinement of S-Phase Precipitates in Al-Cu-Mg Alloys by Quantitative HRTEM / R. Kilaas, V. Radmilovic, U. Dahmen 273 -- Quantitative Mapping of Concentrations and Bonding States by Energy Filtering TEM / J. Mayer, J.M. Plitzko 279 --".
catalog title "Advances in materials problem solving with the electron microscope : symposium held November 30-December 3, 1999, Boston, Massachusetts, U.S.A. / editors, Jim Bentley ... [et al.].".
catalog type "Conference proceedings. fast".
catalog type "text".