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- catalog contributor b12354675.
- catalog created "2001.".
- catalog date "2001".
- catalog date "2001.".
- catalog dateCopyrighted "2001.".
- catalog description "Division of Engineering and Applied Sciences.".
- catalog description "Thesis (Ph. D., Division of Engineering and Applied Sciences (Applied Physics))--Harvard University, 2001.".
- catalog extent "xvi, 181 leaves :".
- catalog issued "2001".
- catalog issued "2001.".
- catalog language "eng".
- catalog subject "Thin films, Multilayered.".
- catalog subject "X-rays Scattering.".
- catalog title "Stress in Cu thin films and Ag/Ni multilayers / a thesis presented by Dillon Dodd Fong.".
- catalog type "text".