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catalog contributor b12581898.
catalog created "c2003.".
catalog date "2003".
catalog date "c2003.".
catalog dateCopyrighted "c2003.".
catalog description "1.1. Ion Scattering Spectrometry 1 -- 1.2. Importance of Surfaces 2 -- 1.3. Survey of Ion-Surface Interactions 3 -- 1.4. Historical Development of Ion Scattering Spectrometry 5 -- 1.5. Other Types of Ion Spectrometeries 7 -- 1.6. Features of Ion Scattering Spectra 7 -- 2. Theoretical Description of Atomic Collisions 11 -- 2.1. Kinematics of Atomic Collisions 11 -- 2.2. Dynamics of Atomic Collisions 18 -- 2.2.1. Interaction Potential 18 -- 2.2.2. Scattering Integral 21 -- 2.2.3. Binary Collision Approximation 24 -- 2.2.4. Small Angle Approximation 28 -- 2.2.5. Differential Scattering Cross Section 29 -- 2.3. Multiple Collisions 31 -- 2.3.1. Directional Effects in Ordered Solids 31 -- 2.3.2. Shadowing and Blocking Cones 34 -- Appendix 2.1. Generalized Deflection Function 40 -- 3. Experimental Methods 42 -- 3.1. General Description of an Ion Scattering Spectrometer System".
catalog description "42 -- 3.1.1. Basic Components 42 -- 3.1.2. Vacuum Chamber and Pumping System 43 -- 3.1.3. Sample Manipulation and Cleaning 44 -- 3.1.4. Ion Source and Beam Line 45 -- 3.1.5. Other in situ Analysis Techniques 46 -- 3.1.6. Analyzers 46 -- 3.1.7. Spectrometer Transmission Function 49 -- 3.1.8. Detectors: Channel Electron Multipliers and Microchannel Plates 51 -- 3.2. Time-of-Flight Scattering and Recoiling Spectrometer 53 -- 3.2.1. Vacuum Chamber 53 -- 3.2.2. Ion Beam Line 56 -- 3.2.3. Pulsing System 57 -- 3.2.4. Channel Electron Multiplier Detector 57 -- 3.3. Coaxial Scattering Spectrometer 58 -- 3.4. Scattering and Recoiling Imaging Spectrometer 59 -- 3.4.1. General Description 59 -- 3.4.2. Vacuum Chamber and Pumping 60 -- 3.4.3. Sample Manipulator and Detector Goniometer 61 -- 3.4.4. Pulsed Ion Beam 62 -- 3.4.5. Microchannel Plate Detector 62 -- 3.4.6.".
catalog description "9.3.2. Mechanism, Dynamics, and Quantitation of the Cs[superscript +]-RIS Process 238 -- 9.4. Application of the Cs[superscript +] RIS Technique 243 -- 9.4.1. Identification of Surface Molecules 243 -- 9.4.2. Surface Reactions and Intermediates 244 -- 9.4.3. Application to Molecular Films: Reaction on Ice 248 -- 10. Bibliography of Ion Scattering Publications 256.".
catalog description "Close Encounter (Quasi-Molecular Mechanism) 187 -- 8.1.3. Inelastic Energy Losses 190 -- 8.2. Examples of Experimental Studies -- Charge Exchange Phenomena 194 -- 8.2.1. Negative Ion Formation via Resonance Processes 195 -- 8.2.2. Quasi-Resonant Charge-Exchange 199 -- 8.2.3. Slow, Highly Charged Ions 200 -- 8.2.4. Complex Matrices 201 -- 8.2.5. Rare Gas Ion Interactions with Silicon 205 -- 8.2.6. Measurements of Inelastic Energy Loss and Connection to the Charge Fraction 212 -- 8.3. Theoretical Methods 217 -- 9. Hyperthermal Reactive Ion Scattering for Molecular Analysis on Surfaces -- 9.2. Characteristic Features of Hyperthermal Ion-Surface Collisions 227 -- 9.2.1. Scattering of Hyperthermal Projectiles from Surfaces 227 -- 9.2.2. Low-Energy Sputtering 231 -- 9.3. Reactive Ion Scattering of Hyperthermal Cs[superscript +] Beams 235 -- 9.3.1. Basic Description of Cs[superscript +] RIS 235 --".
catalog description "Includes bibliographical references (p. 256-301) and index.".
catalog description "Multiple Stop Time to Digital Converter 64 -- 3.4.7. Ion Fraction Images 65 -- 3.5. Mass and Charge Selection of Pulsed Ion Beams Using Sequential Deflection Pulses 66 -- 3.5.1. Example of Sequential Deflection Pulses 68 -- 3.6. Ion Scattering and Recoiling from Liquid Surfaces 70 -- 4. General Features of Ion Scattering and Recoiling Spectra 73 -- 4.1. Energy Spectra 73 -- 4.2. Time-of-Flight Spectra 75 -- 4.2.1. Spectral Interpretation 75 -- 4.2.2. Spectral Intensities 78 -- 4.2.3. Spectral Sensitivity 79 -- 4.2.4. Examples of TOF Spectra 80 -- 4.3. Recoiling Spectra without Scattering Spectra 87 -- 4.4. Sampling Depth 89 -- 4.5. Attributes of the Ion Scattering Technique 92 -- 4.6. Comparison to Other Surface Elemental Analysis Techniques 94 -- 4.6.1. Diffraction Methods 94 -- 4.6.2. High-Energy Ion Scattering 95 -- 4.6.3. Helium Atom Scattering 95 -- 4.6.4.".
catalog description "Other Surface Structure Examples from Clean Surfaces 150 -- 7.2. Hydrogen on Surfaces 151 -- 7.2.1. Hydrogen on Pt(111) 151 -- 7.2.2. Hydrogen on Other Surfaces 153 -- 7.3. Oxygen on Surfaces 155 -- 7.3.1. Oxygen on Nickel Surfaces 155 -- 7.3.2. Oxygen on Other Surfaces 156 -- 7.4. Metal Oxide Surfaces 158 -- 7.5. Organic Molecules on Surfaces 159 -- 7.5.1. Methanethiol on Pt(111) 159 -- 7.5.2. Other Organic Molecules on Surfaces 166 -- 7.6. Semiconductor Surfaces 167 -- 7.6.1. Gallium Nitride (GaN) Epilayers on Sapphire 167 -- 7.6.2. Other Semiconductor Surfaces 173 -- 7.7. Epilayers on Nickel 174 -- 7.7.1. Silver on Ni(100) 174 -- 7.7.2. Chlorine on Ni(110) 177 -- 8. Ion-Surface Charge Exchange and Inelastic Energy Losses 181 -- 8.1. Charge Exchange Processes and Interactions 182 -- 8.1.1. Resonant and Auger Processes 182 -- 8.1.2.".
catalog description "Scanning Microscopy 95 -- 4.6.5. Electron Scattering 96 -- 4.6.6. Ionization and Bond-Breaking Techniques 96 -- 5. Structural Analysis from Time-of-Flight Scattering and Recoiling Spectrometry 97 -- 5.1. Atomic Collisions in the keV Range 98 -- 5.2. Structure Analysis 100 -- 5.2.1. Scattering versus Incident Angle [alpha] Scans 101 -- 5.2.2. Scattering versus Azimuthal Angle [delta] Scans 101 -- 5.2.3. Recoiling versus Incident Angle [alpha] Scans 102 -- 5.2.4. Recoiling versus Azimuthal Angle [delta] Scans 105 -- 5.3. Azimuthal Alignment of the Incident Ion Beam 106 -- 5.4. TOF-SARS and LEED 108 -- 6. Real-Space Surface Crystallography from Scattering and Recoiling Imaging Spectrometry 111 -- 6.1. An Imaging Spectrometry from Nature's Own Atomic Lenses 111 -- 6.2. Shadowing and Blocking 114 -- 6.3. Azimuthal Equidistant Mapping and Projection of SARIgrams 115 -- 6.4.".
catalog description "Simulated and Experimental SARIgrams 118 -- 6.5. Termination Layer of CdS(0001) 118 -- 6.6. Chemisorption Site of Chlorine on Ni(110) 123 -- 6.7. Quantitative Analysis of the Pt(111) Surface 125 -- 6.8. Direct Detection of Hydrogen Atoms on Pt(111) 129 -- 6.8.1. Clean Pt(111) 129 -- 6.8.2. Pt(111)-(1 x 1)-H 130 -- 6.9. Interpretation of SARIgrams 131 -- 6.10. Quantitative Analysis of SARIS Images 131 -- 6.10.1. SARIS Frames 131 -- 6.10.2. Blocking Cones 135 -- 6.10.3. Two-Atom Model for Blocking Cones 135 -- 6.11. Advantages of SARIS 137 -- 7. Applications of TOF-SARS and SARIS to Surface Structure Analysis 141 -- 7.1. Clean Surfaces: Reconstruction and Relaxation 141 -- 7.1.1. Surface Periodicity from TOF-SARS Azimuthal Angle Scans 141 -- 7.1.2. Interlayer Spacings from TOF-SARS Incident Angle Scans 143 -- 7.1.3. Surface Structure from SARIS Images 148 -- 7.1.4.".
catalog extent "xvi, 306 p. :".
catalog identifier "0471202770".
catalog isPartOf "Wiley-Interscience series on mass spectrometry".
catalog issued "2003".
catalog issued "c2003.".
catalog language "eng".
catalog publisher "Hoboken, N.J. : Wiley-Interscience,".
catalog subject "Ion mobility spectroscopy.".
catalog subject "Ions Scattering.".
catalog subject "QC702.7.S3 R33 2003".
catalog tableOfContents "1.1. Ion Scattering Spectrometry 1 -- 1.2. Importance of Surfaces 2 -- 1.3. Survey of Ion-Surface Interactions 3 -- 1.4. Historical Development of Ion Scattering Spectrometry 5 -- 1.5. Other Types of Ion Spectrometeries 7 -- 1.6. Features of Ion Scattering Spectra 7 -- 2. Theoretical Description of Atomic Collisions 11 -- 2.1. Kinematics of Atomic Collisions 11 -- 2.2. Dynamics of Atomic Collisions 18 -- 2.2.1. Interaction Potential 18 -- 2.2.2. Scattering Integral 21 -- 2.2.3. Binary Collision Approximation 24 -- 2.2.4. Small Angle Approximation 28 -- 2.2.5. Differential Scattering Cross Section 29 -- 2.3. Multiple Collisions 31 -- 2.3.1. Directional Effects in Ordered Solids 31 -- 2.3.2. Shadowing and Blocking Cones 34 -- Appendix 2.1. Generalized Deflection Function 40 -- 3. Experimental Methods 42 -- 3.1. General Description of an Ion Scattering Spectrometer System".
catalog tableOfContents "42 -- 3.1.1. Basic Components 42 -- 3.1.2. Vacuum Chamber and Pumping System 43 -- 3.1.3. Sample Manipulation and Cleaning 44 -- 3.1.4. Ion Source and Beam Line 45 -- 3.1.5. Other in situ Analysis Techniques 46 -- 3.1.6. Analyzers 46 -- 3.1.7. Spectrometer Transmission Function 49 -- 3.1.8. Detectors: Channel Electron Multipliers and Microchannel Plates 51 -- 3.2. Time-of-Flight Scattering and Recoiling Spectrometer 53 -- 3.2.1. Vacuum Chamber 53 -- 3.2.2. Ion Beam Line 56 -- 3.2.3. Pulsing System 57 -- 3.2.4. Channel Electron Multiplier Detector 57 -- 3.3. Coaxial Scattering Spectrometer 58 -- 3.4. Scattering and Recoiling Imaging Spectrometer 59 -- 3.4.1. General Description 59 -- 3.4.2. Vacuum Chamber and Pumping 60 -- 3.4.3. Sample Manipulator and Detector Goniometer 61 -- 3.4.4. Pulsed Ion Beam 62 -- 3.4.5. Microchannel Plate Detector 62 -- 3.4.6.".
catalog tableOfContents "9.3.2. Mechanism, Dynamics, and Quantitation of the Cs[superscript +]-RIS Process 238 -- 9.4. Application of the Cs[superscript +] RIS Technique 243 -- 9.4.1. Identification of Surface Molecules 243 -- 9.4.2. Surface Reactions and Intermediates 244 -- 9.4.3. Application to Molecular Films: Reaction on Ice 248 -- 10. Bibliography of Ion Scattering Publications 256.".
catalog tableOfContents "Close Encounter (Quasi-Molecular Mechanism) 187 -- 8.1.3. Inelastic Energy Losses 190 -- 8.2. Examples of Experimental Studies -- Charge Exchange Phenomena 194 -- 8.2.1. Negative Ion Formation via Resonance Processes 195 -- 8.2.2. Quasi-Resonant Charge-Exchange 199 -- 8.2.3. Slow, Highly Charged Ions 200 -- 8.2.4. Complex Matrices 201 -- 8.2.5. Rare Gas Ion Interactions with Silicon 205 -- 8.2.6. Measurements of Inelastic Energy Loss and Connection to the Charge Fraction 212 -- 8.3. Theoretical Methods 217 -- 9. Hyperthermal Reactive Ion Scattering for Molecular Analysis on Surfaces -- 9.2. Characteristic Features of Hyperthermal Ion-Surface Collisions 227 -- 9.2.1. Scattering of Hyperthermal Projectiles from Surfaces 227 -- 9.2.2. Low-Energy Sputtering 231 -- 9.3. Reactive Ion Scattering of Hyperthermal Cs[superscript +] Beams 235 -- 9.3.1. Basic Description of Cs[superscript +] RIS 235 --".
catalog tableOfContents "Multiple Stop Time to Digital Converter 64 -- 3.4.7. Ion Fraction Images 65 -- 3.5. Mass and Charge Selection of Pulsed Ion Beams Using Sequential Deflection Pulses 66 -- 3.5.1. Example of Sequential Deflection Pulses 68 -- 3.6. Ion Scattering and Recoiling from Liquid Surfaces 70 -- 4. General Features of Ion Scattering and Recoiling Spectra 73 -- 4.1. Energy Spectra 73 -- 4.2. Time-of-Flight Spectra 75 -- 4.2.1. Spectral Interpretation 75 -- 4.2.2. Spectral Intensities 78 -- 4.2.3. Spectral Sensitivity 79 -- 4.2.4. Examples of TOF Spectra 80 -- 4.3. Recoiling Spectra without Scattering Spectra 87 -- 4.4. Sampling Depth 89 -- 4.5. Attributes of the Ion Scattering Technique 92 -- 4.6. Comparison to Other Surface Elemental Analysis Techniques 94 -- 4.6.1. Diffraction Methods 94 -- 4.6.2. High-Energy Ion Scattering 95 -- 4.6.3. Helium Atom Scattering 95 -- 4.6.4.".
catalog tableOfContents "Other Surface Structure Examples from Clean Surfaces 150 -- 7.2. Hydrogen on Surfaces 151 -- 7.2.1. Hydrogen on Pt(111) 151 -- 7.2.2. Hydrogen on Other Surfaces 153 -- 7.3. Oxygen on Surfaces 155 -- 7.3.1. Oxygen on Nickel Surfaces 155 -- 7.3.2. Oxygen on Other Surfaces 156 -- 7.4. Metal Oxide Surfaces 158 -- 7.5. Organic Molecules on Surfaces 159 -- 7.5.1. Methanethiol on Pt(111) 159 -- 7.5.2. Other Organic Molecules on Surfaces 166 -- 7.6. Semiconductor Surfaces 167 -- 7.6.1. Gallium Nitride (GaN) Epilayers on Sapphire 167 -- 7.6.2. Other Semiconductor Surfaces 173 -- 7.7. Epilayers on Nickel 174 -- 7.7.1. Silver on Ni(100) 174 -- 7.7.2. Chlorine on Ni(110) 177 -- 8. Ion-Surface Charge Exchange and Inelastic Energy Losses 181 -- 8.1. Charge Exchange Processes and Interactions 182 -- 8.1.1. Resonant and Auger Processes 182 -- 8.1.2.".
catalog tableOfContents "Scanning Microscopy 95 -- 4.6.5. Electron Scattering 96 -- 4.6.6. Ionization and Bond-Breaking Techniques 96 -- 5. Structural Analysis from Time-of-Flight Scattering and Recoiling Spectrometry 97 -- 5.1. Atomic Collisions in the keV Range 98 -- 5.2. Structure Analysis 100 -- 5.2.1. Scattering versus Incident Angle [alpha] Scans 101 -- 5.2.2. Scattering versus Azimuthal Angle [delta] Scans 101 -- 5.2.3. Recoiling versus Incident Angle [alpha] Scans 102 -- 5.2.4. Recoiling versus Azimuthal Angle [delta] Scans 105 -- 5.3. Azimuthal Alignment of the Incident Ion Beam 106 -- 5.4. TOF-SARS and LEED 108 -- 6. Real-Space Surface Crystallography from Scattering and Recoiling Imaging Spectrometry 111 -- 6.1. An Imaging Spectrometry from Nature's Own Atomic Lenses 111 -- 6.2. Shadowing and Blocking 114 -- 6.3. Azimuthal Equidistant Mapping and Projection of SARIgrams 115 -- 6.4.".
catalog tableOfContents "Simulated and Experimental SARIgrams 118 -- 6.5. Termination Layer of CdS(0001) 118 -- 6.6. Chemisorption Site of Chlorine on Ni(110) 123 -- 6.7. Quantitative Analysis of the Pt(111) Surface 125 -- 6.8. Direct Detection of Hydrogen Atoms on Pt(111) 129 -- 6.8.1. Clean Pt(111) 129 -- 6.8.2. Pt(111)-(1 x 1)-H 130 -- 6.9. Interpretation of SARIgrams 131 -- 6.10. Quantitative Analysis of SARIS Images 131 -- 6.10.1. SARIS Frames 131 -- 6.10.2. Blocking Cones 135 -- 6.10.3. Two-Atom Model for Blocking Cones 135 -- 6.11. Advantages of SARIS 137 -- 7. Applications of TOF-SARS and SARIS to Surface Structure Analysis 141 -- 7.1. Clean Surfaces: Reconstruction and Relaxation 141 -- 7.1.1. Surface Periodicity from TOF-SARS Azimuthal Angle Scans 141 -- 7.1.2. Interlayer Spacings from TOF-SARS Incident Angle Scans 143 -- 7.1.3. Surface Structure from SARIS Images 148 -- 7.1.4.".
catalog title "Principles and applications of ion scattering spectrometry : surface chemical and structural analysis / J. Wayne Rabalais.".
catalog type "text".