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- catalog contributor b12588918.
- catalog contributor b12588919.
- catalog contributor b12588920.
- catalog created "c2000.".
- catalog date "2000".
- catalog date "c2000.".
- catalog dateCopyrighted "c2000.".
- catalog description "1. The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy / David J. Dingley -- 2. Theoretical Framework for Electron Backscatter Diffraction / Valerie Randle -- 3. Representations of Texture in Orientation Space / Krishna Rajan -- 4. Rodrigues-Frank Representations of Crystallographic Texture / Krishna Rajan -- 5. Fundamentals of Automated EBSD / Stuart I. Wright -- 6. Studies on the Accuracy of Electron Backscatter Diffraction Measurements / Melik C. Demirel, Bassem S. El-Dasher and Brent L. Adams / [and others] -- 7. Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope / Joseph R. Michael -- 8. Three-Dimensional Orientation Imaging / Dorte Juul Jensen.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xvi, 339 p. :".
- catalog identifier "030646487X".
- catalog issued "2000".
- catalog issued "c2000.".
- catalog language "eng".
- catalog publisher "New York : Kluwer Academic,".
- catalog subject "620.1/1299 21".
- catalog subject "Crystallography.".
- catalog subject "Materials Microscopy.".
- catalog subject "Scanning electron microscopy.".
- catalog subject "TA417.23 .E419 2000".
- catalog tableOfContents "1. The Development of Automated Diffraction in Scanning and Transmission Electron Microscopy / David J. Dingley -- 2. Theoretical Framework for Electron Backscatter Diffraction / Valerie Randle -- 3. Representations of Texture in Orientation Space / Krishna Rajan -- 4. Rodrigues-Frank Representations of Crystallographic Texture / Krishna Rajan -- 5. Fundamentals of Automated EBSD / Stuart I. Wright -- 6. Studies on the Accuracy of Electron Backscatter Diffraction Measurements / Melik C. Demirel, Bassem S. El-Dasher and Brent L. Adams / [and others] -- 7. Phase Identification Using Electron Backscatter Diffraction in the Scanning Electron Microscope / Joseph R. Michael -- 8. Three-Dimensional Orientation Imaging / Dorte Juul Jensen.".
- catalog title "Electron backscatter diffraction in materials science / edited by Adam J. Schwartz, Mukul Kumar, and Brent L. Adams.".
- catalog type "text".