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- catalog contributor b12599792.
- catalog created "2002.".
- catalog date "2002".
- catalog date "2002.".
- catalog dateCopyrighted "2002.".
- catalog description "1. Structural Characterization of Crystalline and Non-crystalline Materials -- A Brief Background of Current Requirements -- 2. Experimental Determination of Partial and Environmental Structure Functions in Non-crystalline Systems -- Fundamental Aspects -- 3. Nature of Anomalous X-ray Scattering and Its Application to the Structural Analysis of Crystalline and Non-crystalline Systems -- 4. Experimental Determination of the Anomalous Dispersion Factors of X-rays -- Theoretical Experimental Issues -- 5. In-House Equipment and Synchrotron Radiation Facilities for Anomalous X-ray Scattering -- 6. Selected Examples of Structural Determination for Crystalline Materials Using the AXS Method.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xiii, 214 p. :".
- catalog identifier "3540434437 (alk. paper)".
- catalog isPartOf "Springer tracts in modern physics ; 179.".
- catalog isPartOf "Springer tracts in modern physics, 0081-3869 ; v. 179".
- catalog issued "2002".
- catalog issued "2002.".
- catalog language "eng".
- catalog publisher "New York : Springer,".
- catalog subject "539 s 548/.83 21".
- catalog subject "QC1 .S797 vol. 179 QC482.S3".
- catalog subject "X-ray crystallography.".
- catalog subject "X-rays Scattering.".
- catalog tableOfContents "1. Structural Characterization of Crystalline and Non-crystalline Materials -- A Brief Background of Current Requirements -- 2. Experimental Determination of Partial and Environmental Structure Functions in Non-crystalline Systems -- Fundamental Aspects -- 3. Nature of Anomalous X-ray Scattering and Its Application to the Structural Analysis of Crystalline and Non-crystalline Systems -- 4. Experimental Determination of the Anomalous Dispersion Factors of X-rays -- Theoretical Experimental Issues -- 5. In-House Equipment and Synchrotron Radiation Facilities for Anomalous X-ray Scattering -- 6. Selected Examples of Structural Determination for Crystalline Materials Using the AXS Method.".
- catalog title "Anomalous X-ray scattering for materials characterization : atomic-scale structure determination / Yoshio Waseda.".
- catalog type "text".