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catalog alternative "Electrically based microstructural characterization 3".
catalog alternative "Electrically based microstructural characterization three".
catalog contributor b12634207.
catalog created "c2002.".
catalog date "2002".
catalog date "c2002.".
catalog dateCopyrighted "c2002.".
catalog description "Capacitance Spectroscopy of n-i-n and p-i-p GaAs Sandwich Structures With Nanoscale as Clusters in the i-Layers / V. V. Chaldyshev, P. N. Brunkov, A. V. Chernigovskii, A. Moskalenko, N. A. Bert, S. G. Konnikov, V. V. Preobrazhenskii, M. A. Putyato and B. R. Semyagin -- Scaling Effects in Al[subscript 72]Mn[subscript 22]Si[subscript 6] Quasicrystals Deduced From the Pressure and Temperature Dependence of the Resistance / John K. Vassiliou, Jens W. Otto, A. Pothireddy and E. A. Simons -- An Ab Initio Investigation on the Effects of Impurity in Aluminum Grain Boundary / Guang-Hong Lu, Tomoyuki Tamura, Masao Kamiko, Masanori Kohyama and Ryoichi Yamamoto -- Effect of Grain Boundaries and Indentation Load on the Electrical Properties of Nickel Base Super-Alloys / Kimberly Piakos, Celestina Laboy and Rosario A. Gerhardt -- ".
catalog description "Damage Detectability on Aluminum Alloy Panels Under Composite Patching by Various NDT Techniques / Antonia Moropoulou, Niki Kouloumbi, Zaira P. Marioli-Riga, Nicolas P. Avdelidis and Paraskevi Pantazopoulou -- A Percolation Equation for Modeling Experimental Results for Continuum Percolation Systems / D. S. McLachlan, C. Chiteme, W. D. Heiss and Junjie Wu -- Percolation Properties of Cellular Composite Systems / C. Chiteme and D. S. McLachlan -- Electrical Conductivity of Ionic and Electronic Mixture / Gyeong Man Choi, Joon Hee Kim and Young Min Park -- AC Conductivity Based Microstructural Characterization of Yttria Stabilized Zirconia / G. Sauti and D. S. McLachlan -- Impedance Spectroscopy Study of Ionic Diffusion in Polycrystalline ZrO[subscript 2]:Y[subscript 2]O[subscript 3] Solid Solution / Fabio C. Fonscca, Eliana N. S. Muccillo and R. Muccillo -- ".
catalog description "Determination of Surface Space Charge Density on Semiconductor From Displacement Current-Voltage Curve Using a Scanning Vibrating Probe / Yutaka Majima, Tomohiko Masuda, Setsuri Uehara, Atsushi Okuda and Mitsumasa Iwamoto -- Conductance-Transient Three-Dimensional Profiling of Disordered Induced Gap States on Metal-Insulator-Semiconductor Structures / H. Castan, S. Duenas, J. Barbolla, I. Martil and G. Gonzalez-Diaz -- Electrically Active Deep Levels in ScN / Florentina Perjeru, Xuewen Bai and Martin F. Kordesch -- Materials Characterization and Device Performance of a CMR-Ferroelectric Heterostructure / S. R. Surthi, S. Kotru and R. K. Pandey -- Microwave Transient Photoconductivity Studies in Porous Semiconductors / Horia-Eugen Porteanu, Elisaveta Konstantinova, Vladimir Kytin, Oleg Loginenko, Victor Timoshenko, Thomas Dittrich and Frederick Koch -- Improving GaAs Chip Yield and Enhancing Reliability of GaAs Devices / Kanti Prasad -- ".
catalog description "Electrical Characterization of Inhomogeneous and Heterogeneous Systems With Microstructural Periodicity / Joachim Maier -- Effects of Grain Size Distribution on Cole-Cole Plots of Polycrystalline Spinels / M. P. Gutierrez-Amador and R. Valenzuela -- Microstructural Development and Properties of (1-x)wt% Ba[subscript 0.55]Sr[subscript 0.45]TiO[subscript 3]-x wt% MgO Bulk Ferroelectrics / Costas G. Fountzoulas -- Computer Simulation on the Relations Between the Porosity and the Microwave Properties in Dielectric Ceramics / Jae-Hwan Park, Jae-Gwan Park and Yoonho Kim -- Microstructure and Damage of the Interlaminar Interface of Carbon Fiber Polymer-Matrix Composites, Monitored by Contact Electrical Resistivity Measurement / Shoukai Wang, Victor H. Guerrero, Daniel P. Kowalik and D. D. L. Chung -- ".
catalog description "Improvement of Characteristics in Highly Reliable Thin Film Diode With Anodic Tantalum Pentoxide by Low Temperature Annealing Conditions / Chan-Jae Lee, Sung-Jei Hong, Sung-Kyu Park, Yong-Hoon Kim, Min-Gi Kwak, Won-Keun Kim and Jeong-In Han -- Application of a Buffer Layer for the Dielectric Measurement of Thin Polymer Films / C. K. Chiang and Wataru Sakai -- Analysis of Ion Implantation Damage in Silicon Wafers by a Contactless Microwave Diagnostic / Richard K. Abrenkiel and B. Lojek -- Depth Dependence of Dopant Induced Features on the Si(100)2x1:H Surface and Its Application for Three Dimensional Dopant Profiling / Lequn Liu, Jixin Yu and Joseph W. Lyding -- Influence of Substrate Annealing Temperature Upon Deep Levels in n-Type 4H SiC / Martin E. Kordesch, Florentina Perjeru and R. L. Woodin -- Charge-Based Deep Level Transient Spectroscopy of Semiconducting and Insulating Materials / V. I. Polyakov, A. I. Rukovishnokov, N. M. Rossukanyi and B. Druz -- ".
catalog description "Incentives for Using LEIM in the Investigation of Corrosion Initiation on Organic Coated Alloys / S. R. Taylor and A. M. Mierisch -- Electrochemical Porosimetry / Hyun-Kon Song and Kun-Hong Lee -- The Use of XANES and ELNES for the Characterization of Stabilized Zirconia / David W. McComb, Sergei Ostanin, Dimitris Vlachos, Alan J. Craven, Michael W. Finnis, Anthony T. Paxton and Ali Alavi -- FT-IR Spectra of Li(Al[subscript x]Co[subscript 1-x])O[subscript 2] (x=0.1-0.5) / W. Hao, C. Li, X. Meng, G. Chen and W. Xu -- Investigation of Pt/Si/CeO[subscript 2]/Pt MOS Device Structure by Impedance Spectroscopy / Jyrki Lappalainen, Darja Kek and Harry L. Tuller -- Radio-Frequency Impedance Analysis of Anodic Tantalum Pentoxide Thin Films / S. Duenas, H. Castan, J. Barbolla, R. R. Kola and P. A. Sullivan -- ".
catalog description "Includes bibliographical references and indexes.".
catalog description "Phase Transformation Hysteresis in a Plutonium Alloy System: Modeling the Resistivity During the Transformation / Jeffery J. Haslam, Mark A. Wall, David L. Johnson, David J. Mayhall and Adam J. Schwartz -- Detection of Compositional Fluctuations in High Temperature Exposed Waspaloy / Xiaodong Zou, Tariq Makram and Rosario A. Gerhardt -- Refractory Thin-Film Metallizations With Controlled Stress and Electrical Resistivity / Ilan Golecki and Margaret Eagan -- Surface Roughness and Surface-Induced Resistivity of Thin Gold Films on Mica / Raul C. Munoz, German Kremer, Luis Moraga, Guillermo Vidal and Claudio Arenas -- Influence of Confinement on Molecular Reorientational Dynamics of Liquid Crystals: Broadband Dielectric Spectroscopy Investigations / Fouad M. Aliev -- The Structure and Electrical Properties of Polyaniline / Runqing Ou, Robert J. Samuels and Rosario A. Gerhardt -- ".
catalog description "Relation Between Heat-Treatment Temperature and Characteristics of Polyparaphenylene (PPP)-Based Carbon Materials for Lithium Ion Secondary Batteries / Kozo Osawa, Tatsuo Nakazawa, Kyoich Oshida, Morinobu Endo and Mildred S. Dresselhaus -- Structure and Electronic Properties of Diamond-Like Carbon and its Heat-Treatment Effect / Kazuyuki Takai, Meigo Oga, Hirohiko Sato, Toshiaki Enoki, Yoshimasa Ohki, Akira Taomoto, Kazutomo Suenaga and Sumio Iijima.".
catalog description "The Influence of Filler Properties on the Strong PTC Effect of Resistivity in Polymer Based Conducting Composites / Joachim Glatz-Reichenbach and Ralf Strumpler -- Sensitivity and Resolution Limits in Scanning Capacitance Microscopy / Stefan Lanyi and Miloslav Hruskovic -- Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images / Sergei V. Kalinin and Dawn A. Bonnell -- Magnetic Force Microscopy Signatures of Defects in Current-Carrying Lines / Ruchirej Yongsunthon, Ellen D. Williams, Andrei Stanishevsky, Jonathan McCoy, Robert Pego, Philip J. Rous and Martin Peckerar -- Displacement Current Staircase Due to Coulomb Blockade / Kouhei Nagano, Atsushi Okuda and Yutaka Majima -- Electromagnetic Waves Through Disordered Systems: Comparison of Intensity, Transmission and Conductance / Fredy R. Zypman and Gabriel Cwilich -- Impedance Spectroscopy in Ferromagnetic Materials / Raul Valenzuela -- ".
catalog extent "xi, 356 p. :".
catalog hasFormat "Electrically based microstructural characterization III.".
catalog identifier "1558996354".
catalog isFormatOf "Electrically based microstructural characterization III.".
catalog isPartOf "Materials Research Society symposia proceedings ; v. 699.".
catalog isPartOf "Materials Research Society symposium proceedings ; v. 699".
catalog issued "2002".
catalog issued "c2002.".
catalog language "eng".
catalog publisher "Warrendale, PA : Materials Research Society,".
catalog relation "Electrically based microstructural characterization III.".
catalog subject "620.1/1299 21".
catalog subject "Materials Microscopy Congresses.".
catalog subject "Microstructure Congresses.".
catalog subject "TA417.23 .E4163 2003".
catalog tableOfContents "Capacitance Spectroscopy of n-i-n and p-i-p GaAs Sandwich Structures With Nanoscale as Clusters in the i-Layers / V. V. Chaldyshev, P. N. Brunkov, A. V. Chernigovskii, A. Moskalenko, N. A. Bert, S. G. Konnikov, V. V. Preobrazhenskii, M. A. Putyato and B. R. Semyagin -- Scaling Effects in Al[subscript 72]Mn[subscript 22]Si[subscript 6] Quasicrystals Deduced From the Pressure and Temperature Dependence of the Resistance / John K. Vassiliou, Jens W. Otto, A. Pothireddy and E. A. Simons -- An Ab Initio Investigation on the Effects of Impurity in Aluminum Grain Boundary / Guang-Hong Lu, Tomoyuki Tamura, Masao Kamiko, Masanori Kohyama and Ryoichi Yamamoto -- Effect of Grain Boundaries and Indentation Load on the Electrical Properties of Nickel Base Super-Alloys / Kimberly Piakos, Celestina Laboy and Rosario A. Gerhardt -- ".
catalog tableOfContents "Damage Detectability on Aluminum Alloy Panels Under Composite Patching by Various NDT Techniques / Antonia Moropoulou, Niki Kouloumbi, Zaira P. Marioli-Riga, Nicolas P. Avdelidis and Paraskevi Pantazopoulou -- A Percolation Equation for Modeling Experimental Results for Continuum Percolation Systems / D. S. McLachlan, C. Chiteme, W. D. Heiss and Junjie Wu -- Percolation Properties of Cellular Composite Systems / C. Chiteme and D. S. McLachlan -- Electrical Conductivity of Ionic and Electronic Mixture / Gyeong Man Choi, Joon Hee Kim and Young Min Park -- AC Conductivity Based Microstructural Characterization of Yttria Stabilized Zirconia / G. Sauti and D. S. McLachlan -- Impedance Spectroscopy Study of Ionic Diffusion in Polycrystalline ZrO[subscript 2]:Y[subscript 2]O[subscript 3] Solid Solution / Fabio C. Fonscca, Eliana N. S. Muccillo and R. Muccillo -- ".
catalog tableOfContents "Determination of Surface Space Charge Density on Semiconductor From Displacement Current-Voltage Curve Using a Scanning Vibrating Probe / Yutaka Majima, Tomohiko Masuda, Setsuri Uehara, Atsushi Okuda and Mitsumasa Iwamoto -- Conductance-Transient Three-Dimensional Profiling of Disordered Induced Gap States on Metal-Insulator-Semiconductor Structures / H. Castan, S. Duenas, J. Barbolla, I. Martil and G. Gonzalez-Diaz -- Electrically Active Deep Levels in ScN / Florentina Perjeru, Xuewen Bai and Martin F. Kordesch -- Materials Characterization and Device Performance of a CMR-Ferroelectric Heterostructure / S. R. Surthi, S. Kotru and R. K. Pandey -- Microwave Transient Photoconductivity Studies in Porous Semiconductors / Horia-Eugen Porteanu, Elisaveta Konstantinova, Vladimir Kytin, Oleg Loginenko, Victor Timoshenko, Thomas Dittrich and Frederick Koch -- Improving GaAs Chip Yield and Enhancing Reliability of GaAs Devices / Kanti Prasad -- ".
catalog tableOfContents "Electrical Characterization of Inhomogeneous and Heterogeneous Systems With Microstructural Periodicity / Joachim Maier -- Effects of Grain Size Distribution on Cole-Cole Plots of Polycrystalline Spinels / M. P. Gutierrez-Amador and R. Valenzuela -- Microstructural Development and Properties of (1-x)wt% Ba[subscript 0.55]Sr[subscript 0.45]TiO[subscript 3]-x wt% MgO Bulk Ferroelectrics / Costas G. Fountzoulas -- Computer Simulation on the Relations Between the Porosity and the Microwave Properties in Dielectric Ceramics / Jae-Hwan Park, Jae-Gwan Park and Yoonho Kim -- Microstructure and Damage of the Interlaminar Interface of Carbon Fiber Polymer-Matrix Composites, Monitored by Contact Electrical Resistivity Measurement / Shoukai Wang, Victor H. Guerrero, Daniel P. Kowalik and D. D. L. Chung -- ".
catalog tableOfContents "Improvement of Characteristics in Highly Reliable Thin Film Diode With Anodic Tantalum Pentoxide by Low Temperature Annealing Conditions / Chan-Jae Lee, Sung-Jei Hong, Sung-Kyu Park, Yong-Hoon Kim, Min-Gi Kwak, Won-Keun Kim and Jeong-In Han -- Application of a Buffer Layer for the Dielectric Measurement of Thin Polymer Films / C. K. Chiang and Wataru Sakai -- Analysis of Ion Implantation Damage in Silicon Wafers by a Contactless Microwave Diagnostic / Richard K. Abrenkiel and B. Lojek -- Depth Dependence of Dopant Induced Features on the Si(100)2x1:H Surface and Its Application for Three Dimensional Dopant Profiling / Lequn Liu, Jixin Yu and Joseph W. Lyding -- Influence of Substrate Annealing Temperature Upon Deep Levels in n-Type 4H SiC / Martin E. Kordesch, Florentina Perjeru and R. L. Woodin -- Charge-Based Deep Level Transient Spectroscopy of Semiconducting and Insulating Materials / V. I. Polyakov, A. I. Rukovishnokov, N. M. Rossukanyi and B. Druz -- ".
catalog tableOfContents "Incentives for Using LEIM in the Investigation of Corrosion Initiation on Organic Coated Alloys / S. R. Taylor and A. M. Mierisch -- Electrochemical Porosimetry / Hyun-Kon Song and Kun-Hong Lee -- The Use of XANES and ELNES for the Characterization of Stabilized Zirconia / David W. McComb, Sergei Ostanin, Dimitris Vlachos, Alan J. Craven, Michael W. Finnis, Anthony T. Paxton and Ali Alavi -- FT-IR Spectra of Li(Al[subscript x]Co[subscript 1-x])O[subscript 2] (x=0.1-0.5) / W. Hao, C. Li, X. Meng, G. Chen and W. Xu -- Investigation of Pt/Si/CeO[subscript 2]/Pt MOS Device Structure by Impedance Spectroscopy / Jyrki Lappalainen, Darja Kek and Harry L. Tuller -- Radio-Frequency Impedance Analysis of Anodic Tantalum Pentoxide Thin Films / S. Duenas, H. Castan, J. Barbolla, R. R. Kola and P. A. Sullivan -- ".
catalog tableOfContents "Phase Transformation Hysteresis in a Plutonium Alloy System: Modeling the Resistivity During the Transformation / Jeffery J. Haslam, Mark A. Wall, David L. Johnson, David J. Mayhall and Adam J. Schwartz -- Detection of Compositional Fluctuations in High Temperature Exposed Waspaloy / Xiaodong Zou, Tariq Makram and Rosario A. Gerhardt -- Refractory Thin-Film Metallizations With Controlled Stress and Electrical Resistivity / Ilan Golecki and Margaret Eagan -- Surface Roughness and Surface-Induced Resistivity of Thin Gold Films on Mica / Raul C. Munoz, German Kremer, Luis Moraga, Guillermo Vidal and Claudio Arenas -- Influence of Confinement on Molecular Reorientational Dynamics of Liquid Crystals: Broadband Dielectric Spectroscopy Investigations / Fouad M. Aliev -- The Structure and Electrical Properties of Polyaniline / Runqing Ou, Robert J. Samuels and Rosario A. Gerhardt -- ".
catalog tableOfContents "Relation Between Heat-Treatment Temperature and Characteristics of Polyparaphenylene (PPP)-Based Carbon Materials for Lithium Ion Secondary Batteries / Kozo Osawa, Tatsuo Nakazawa, Kyoich Oshida, Morinobu Endo and Mildred S. Dresselhaus -- Structure and Electronic Properties of Diamond-Like Carbon and its Heat-Treatment Effect / Kazuyuki Takai, Meigo Oga, Hirohiko Sato, Toshiaki Enoki, Yoshimasa Ohki, Akira Taomoto, Kazutomo Suenaga and Sumio Iijima.".
catalog tableOfContents "The Influence of Filler Properties on the Strong PTC Effect of Resistivity in Polymer Based Conducting Composites / Joachim Glatz-Reichenbach and Ralf Strumpler -- Sensitivity and Resolution Limits in Scanning Capacitance Microscopy / Stefan Lanyi and Miloslav Hruskovic -- Scanning Impedance Microscopy: From Impedance Spectra to Impedance Images / Sergei V. Kalinin and Dawn A. Bonnell -- Magnetic Force Microscopy Signatures of Defects in Current-Carrying Lines / Ruchirej Yongsunthon, Ellen D. Williams, Andrei Stanishevsky, Jonathan McCoy, Robert Pego, Philip J. Rous and Martin Peckerar -- Displacement Current Staircase Due to Coulomb Blockade / Kouhei Nagano, Atsushi Okuda and Yutaka Majima -- Electromagnetic Waves Through Disordered Systems: Comparison of Intensity, Transmission and Conductance / Fredy R. Zypman and Gabriel Cwilich -- Impedance Spectroscopy in Ferromagnetic Materials / Raul Valenzuela -- ".
catalog title "Electrically based microstructural characterization 3".
catalog title "Electrically based microstructural characterization III : symposium held November 26-29, 2001, Boston, Massachusetts, U.S.A. / editors, Rosario A. Gerhardt ... [et al.].".
catalog title "Electrically based microstructural characterization three".
catalog type "Boston (Mass., 2001) swd".
catalog type "Conference proceedings. fast".
catalog type "Kongress. swd".
catalog type "text".