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- catalog abstract ""High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test is Written for the professional and the researcher to help them understand the memories that are being tested."--Jacket.".
- catalog contributor b12720729.
- catalog created "c2003.".
- catalog date "2003".
- catalog date "c2003.".
- catalog dateCopyrighted "c2003.".
- catalog description ""High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test is Written for the professional and the researcher to help them understand the memories that are being tested."--Jacket.".
- catalog description "Design & Test of Memories -- Opening Pandora's Box -- What is a Memory, Test, BIST? -- The Ubiquitous Nature of Memories -- The Complexity of Memories -- It was the best of memories, it was the worst of memories ... -- Testing: Bits is Not Bits -- Best BIST or Bust: The journey toward the best self test -- Ignorance is Not Bliss -- Static Random Access Memories -- SRAM Trends -- The Cell -- Read Data Path -- Write Driver Circuit -- Decoder Circuitry -- Layout Considerations -- Redundancy -- Multi-Port Memories -- Cell Basics -- Multi-Port Memory Timing Issues -- Layout Considerations -- Silicon On Insulator Memories -- Silicon On Insulator Technology -- Memories in SOI -- Layout Considerations -- Content Addressable Memories -- CAM Topology -- Masking -- CAM Features -- Dynamic Random Access Memories -- DRAM Trends -- The DRAM cell -- The DRAM Capacitor -- DRAM Cell Layout -- DRAM Operation -- Non-Volatile Memories -- ROM -- EEPROM & Flash -- The Future of memories -- FeRAM -- MRAM -- Ovonic -- And Beyond -- Memory Testing -- Memory Faults -- A Toast: To Good Memories -- Fault Modeling -- General Fault modeling -- Read Disturb Fault Model -- Pre-charge Faults -- False Write Through -- Data Retention Faults -- SOI Faults -- Decoder Faults -- Multi-port Memory Faults -- Other Fault Models -- Memory Patterns -- Zero-One Pattern -- Exhaustive Test Pattern -- Walking, Marching, and Galloping -- Bit and Word Orientation -- Common Array Patterns -- Common March Patterns -- March C- Pattern.".
- catalog description "Includes bibliographical references (p. [229]-239) and index.".
- catalog extent "xiii, 246 p. :".
- catalog identifier "1402072554 (alk. paper)".
- catalog isPartOf "Frontiers in electronic testing".
- catalog issued "2003".
- catalog issued "c2003.".
- catalog language "eng".
- catalog publisher "Boston : Kluwer Academic,".
- catalog subject "621.39/732 21".
- catalog subject "Computer storage devices Testing.".
- catalog subject "Semiconductor storage devices Testing.".
- catalog subject "TK7895.M4 A27 2003".
- catalog tableOfContents "Design & Test of Memories -- Opening Pandora's Box -- What is a Memory, Test, BIST? -- The Ubiquitous Nature of Memories -- The Complexity of Memories -- It was the best of memories, it was the worst of memories ... -- Testing: Bits is Not Bits -- Best BIST or Bust: The journey toward the best self test -- Ignorance is Not Bliss -- Static Random Access Memories -- SRAM Trends -- The Cell -- Read Data Path -- Write Driver Circuit -- Decoder Circuitry -- Layout Considerations -- Redundancy -- Multi-Port Memories -- Cell Basics -- Multi-Port Memory Timing Issues -- Layout Considerations -- Silicon On Insulator Memories -- Silicon On Insulator Technology -- Memories in SOI -- Layout Considerations -- Content Addressable Memories -- CAM Topology -- Masking -- CAM Features -- Dynamic Random Access Memories -- DRAM Trends -- The DRAM cell -- The DRAM Capacitor -- DRAM Cell Layout -- DRAM Operation -- Non-Volatile Memories -- ROM -- EEPROM & Flash -- The Future of memories -- FeRAM -- MRAM -- Ovonic -- And Beyond -- Memory Testing -- Memory Faults -- A Toast: To Good Memories -- Fault Modeling -- General Fault modeling -- Read Disturb Fault Model -- Pre-charge Faults -- False Write Through -- Data Retention Faults -- SOI Faults -- Decoder Faults -- Multi-port Memory Faults -- Other Fault Models -- Memory Patterns -- Zero-One Pattern -- Exhaustive Test Pattern -- Walking, Marching, and Galloping -- Bit and Word Orientation -- Common Array Patterns -- Common March Patterns -- March C- Pattern.".
- catalog title "High performance memory testing : design principles, fault modeling, and self-test / R. Dean Adams.".
- catalog type "text".