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- catalog contributor b12814953.
- catalog created "2003.".
- catalog date "2003".
- catalog date "2003.".
- catalog dateCopyrighted "2003.".
- catalog description "1. Introduction -- Pt. I. Theoretical Fundamentals of Transmission Electron Microscopy -- 2. Electron Diffraction -- 3. Image Formation -- Pt. II. Digital Image Analysis -- 4. Strain State Analysis -- 5. Lattice Fringe Analysis -- Pt. III. Applications -- 6. Introduction -- 7. In[subscript 0.6]Ga[subscript 0.4]As/GaAs(001) SK Layers -- 8. InAs Quantum Dots -- 9. Electron Holography: AlAs/GaAs Superlattices -- 10. Outlook -- A. List of Acronyms Used -- B. Fourier Transform, Convolutions and [delta]-"Function"".
- catalog description "Includes bibliographical references and index.".
- catalog extent "238 p. :".
- catalog identifier "3540004149 (alk. paper)".
- catalog isPartOf "Springer tracts in modern physics ; 182".
- catalog issued "2003".
- catalog issued "2003.".
- catalog language "eng".
- catalog publisher "New York : Springer,".
- catalog subject "621.3815/2 21".
- catalog subject "QD139.S34 R67 2003".
- catalog subject "Semiconductors Analysis.".
- catalog subject "Semiconductors Microscopy.".
- catalog subject "Transmission electron microscopy.".
- catalog tableOfContents "1. Introduction -- Pt. I. Theoretical Fundamentals of Transmission Electron Microscopy -- 2. Electron Diffraction -- 3. Image Formation -- Pt. II. Digital Image Analysis -- 4. Strain State Analysis -- 5. Lattice Fringe Analysis -- Pt. III. Applications -- 6. Introduction -- 7. In[subscript 0.6]Ga[subscript 0.4]As/GaAs(001) SK Layers -- 8. InAs Quantum Dots -- 9. Electron Holography: AlAs/GaAs Superlattices -- 10. Outlook -- A. List of Acronyms Used -- B. Fourier Transform, Convolutions and [delta]-"Function"".
- catalog title "Transmission electron microscopy of semiconductor nanostructures : an analysis of composition and strain state / Andreas Rosenauer.".
- catalog type "text".