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- catalog contributor b12830288.
- catalog contributor b12830289.
- catalog contributor b12830290.
- catalog created "c2003.".
- catalog date "2003".
- catalog date "c2003.".
- catalog dateCopyrighted "c2003.".
- catalog description "Includes bibliographical references and indexes.".
- catalog extent "xiii, 425 p. :".
- catalog hasFormat "Spatially resolved characterization of local phenomena in materials and nanostructures.".
- catalog identifier "1558996753".
- catalog isFormatOf "Spatially resolved characterization of local phenomena in materials and nanostructures.".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 738.".
- catalog isPartOf "Materials Research Society symposium proceedings ; v. 738".
- catalog issued "2003".
- catalog issued "c2003.".
- catalog language "eng".
- catalog publisher "Warrendale, Pa. : Materials Research Society,".
- catalog relation "Spatially resolved characterization of local phenomena in materials and nanostructures.".
- catalog subject "Nanostructured materials Congresses.".
- catalog subject "Nanotechnology Congresses.".
- catalog subject "Scanning probe microscopy Congresses.".
- catalog subject "Semiconductors Characterization Technique Congresses.".
- catalog subject "TA418.9.N35 S94 2002".
- catalog title "Spatially resolved characterization of local phenomena in materials and nanostructures : symposium held December 2-6, 2002, Boston, Massachusetts / editors, Javier Piqueras ... [et al.].".
- catalog type "text".