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- catalog contributor b12853680.
- catalog contributor b12853681.
- catalog contributor b12853682.
- catalog contributor b12853683.
- catalog contributor b12853684.
- catalog contributor b12853685.
- catalog created "c2002.".
- catalog date "2002".
- catalog date "c2002.".
- catalog dateCopyrighted "c2002.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xiii, 548 p. :".
- catalog identifier "0819447080".
- catalog isPartOf "Proceedings of SPIE--the International Society for Optical Engineering ; v. 4919.".
- catalog isPartOf "SPIE proceedings series, 0277-786X ; v. 4919".
- catalog issued "2002".
- catalog issued "c2002.".
- catalog language "eng".
- catalog publisher "Bellingham, Wash., USA : SPIE,".
- catalog subject "681/.25 21".
- catalog subject "Detectors Materials Congresses.".
- catalog subject "Metrology Congresses.".
- catalog subject "Optical fiber detectors Materials Congresses.".
- catalog subject "Optoelectronic devices Materials Congresses.".
- catalog subject "Photonics Congresses.".
- catalog subject "TK8360.O67 A35 2002".
- catalog title "Advanced materials and devices for sensing and imaging : 17-18 October 2002, Shanghai, China / Jianquan Yao, Yukihiro Ishii, chairs/editors ; sponsored by SPIE--the International Society for Optical Engineering [and] COS--Chinese Optical Society ; cooperating organizations, Shanghai Jiaotong University (China) ... [et al.] ; supported by National Natural Science Foundation of China ... [et al.].".
- catalog type "text".