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- catalog abstract ""This paper is an analysis of documentary standards related to dimensional metrology information, with recommendations regarding standards development"--P. 1.".
- catalog contributor b12868616.
- catalog contributor b12868617.
- catalog contributor b12868618.
- catalog created "[2001]".
- catalog date "2001".
- catalog date "[2001]".
- catalog dateCopyrighted "[2001]".
- catalog description ""This paper is an analysis of documentary standards related to dimensional metrology information, with recommendations regarding standards development"--P. 1.".
- catalog description "Includes bibliographical references (p. 71).".
- catalog extent "vi, 71 p. :".
- catalog isPartOf "NISTIR ; 6847".
- catalog issued "2001".
- catalog issued "[2001]".
- catalog language "eng".
- catalog publisher "Gaithersburg, MD : U.S. Dept. of Commerce, Technology Administration, Manufacturing Engineering Laboratory, National Institute of Standards and Technology,".
- catalog subject "Engineering design Computer programs.".
- catalog subject "Metrology Computer-aided design.".
- catalog subject "Metrology Standards.".
- catalog subject "QC100.A2 A53".
- catalog title "Analysis of dimensional metrology standards [microform] / John Evans ... [et al.].".
- catalog type "text".