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- catalog contributor b12960509.
- catalog contributor b12960510.
- catalog created "c2002.".
- catalog date "2002".
- catalog date "c2002.".
- catalog dateCopyrighted "c2002.".
- catalog description "1. X-ray Physics / Andrzej A. Markowicz -- 2. Wavelength-Dispersive X-ray Fluorescence / Jozef A. Helsen and Andrzej Kuczumow -- 3. Energy-Dispersive X-ray Fluorescence Analysis Using X-ray Tube Excitation / Andrew T. Ellis -- 4. Spectrum Evaluation / Piet Van Espen -- 5. Quantification of Infinitely Thick Specimens by XRF Analysis / Johan L. de Vries and Bruno A. R. Vrebos -- 6. Quantification in XRF Analysis of Intermediate-Thickness Samples / Andrzej A. Markowicz and Rene E. Van Grieken -- 7. Radioisotope-Excited X-ray Analysis / Stanislaw Piorek -- 8. Synchrotron Radiation-Induced X-ray Emission / Keith W. Jones -- 9. Total Reflection X-ray Fluorescence / Peter Kregsamer, Christina Streli and Peter Wobrauschek -- 10. Polarized Beam X-ray Fluorescence Analysis / Joachim Heckel and Richard W. Ryon -- 11. Microbeam XRF / Anders Rindby and Koen H. A. Janssens -- 12. Particle-Induced X-ray Emission Analysis / Willy Maenhaut and Klas G. Malmqvist -- 13. Electron-Induced X-ray Emission / John A. Small, Dale E. Newbury and John T. Armstrong -- 14. Sample Preparation for X-ray Fluorescence / Martina Schmeling and Rene E. Van Grieken.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xvi, 983 p. :".
- catalog identifier "0824706005 (acid-free paper)".
- catalog isPartOf "Practical spectroscopy ; v. 29".
- catalog issued "2002".
- catalog issued "c2002.".
- catalog language "eng".
- catalog publisher "New York : Marcel Dekker,".
- catalog subject "543/.08586 21".
- catalog subject "QD 96.X2 H236 2002".
- catalog subject "QD96.X2 .H35 2002".
- catalog subject "Spectrometry, X-Ray Emission methods.".
- catalog subject "X-ray spectroscopy.".
- catalog tableOfContents "1. X-ray Physics / Andrzej A. Markowicz -- 2. Wavelength-Dispersive X-ray Fluorescence / Jozef A. Helsen and Andrzej Kuczumow -- 3. Energy-Dispersive X-ray Fluorescence Analysis Using X-ray Tube Excitation / Andrew T. Ellis -- 4. Spectrum Evaluation / Piet Van Espen -- 5. Quantification of Infinitely Thick Specimens by XRF Analysis / Johan L. de Vries and Bruno A. R. Vrebos -- 6. Quantification in XRF Analysis of Intermediate-Thickness Samples / Andrzej A. Markowicz and Rene E. Van Grieken -- 7. Radioisotope-Excited X-ray Analysis / Stanislaw Piorek -- 8. Synchrotron Radiation-Induced X-ray Emission / Keith W. Jones -- 9. Total Reflection X-ray Fluorescence / Peter Kregsamer, Christina Streli and Peter Wobrauschek -- 10. Polarized Beam X-ray Fluorescence Analysis / Joachim Heckel and Richard W. Ryon -- 11. Microbeam XRF / Anders Rindby and Koen H. A. Janssens -- 12. Particle-Induced X-ray Emission Analysis / Willy Maenhaut and Klas G. Malmqvist -- 13. Electron-Induced X-ray Emission / John A. Small, Dale E. Newbury and John T. Armstrong -- 14. Sample Preparation for X-ray Fluorescence / Martina Schmeling and Rene E. Van Grieken.".
- catalog title "Handbook of X-ray spectrometry / edited by René E. Van Grieken, Andrzej A. Markowicz.".
- catalog type "text".