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- catalog abstract "This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.".
- catalog contributor b13132178.
- catalog created "c2004.".
- catalog date "2004".
- catalog date "c2004.".
- catalog dateCopyrighted "c2004.".
- catalog description "A Brief Introduction to the Topic -- Basic Principles of X-Ray Diffuse Scattering on Mesoscopic Structures -- Experimental Optimization -- A Model System: LPE SiGe/Si(001) Islands -- Dynamical Scattering at Grazing Incidence -- Characterization of Quantum Dots -- Characterization of Interface Roughness -- Appendix.".
- catalog description "Includes bibliographical references and index.".
- catalog description "This monograph represents a critical survey of the outstanding capabilities of X-ray diffuse scattering for the structural characterization of mesoscopic material systems. The mesoscopic regime comprises length scales ranging from a few up to some hundreds of nanometers. It is of particular relevance at semiconductor layer systems where, for example, interface roughness or low-dimensional objects such as quantum dots and quantum wires have attracted much interest. An extensive overview of the present state-of-the-art theory of X-ray diffuse scattering at mesoscopic structures is given followed by a valuable description of various experimental techniques. Selected up-to-date examples are discussed. The aim of the present book is to combine aspects of self-organized growth of mesoscopic structures with corresponding X-ray diffuse scattering experiments.".
- catalog extent "x, 202 p. :".
- catalog identifier "3540201793 (acid-free paper)".
- catalog isPartOf "Springer tracts in modern physics ; 199.".
- catalog isPartOf "Springer tracts in modern physics, 0081-3869 ; v. 199".
- catalog issued "2004".
- catalog issued "c2004.".
- catalog language "eng".
- catalog publisher "Berlin ; New York : Springer,".
- catalog subject "539 s 539.7/222 22".
- catalog subject "Chemistry.".
- catalog subject "Mesoscopic phenomena (Physics)".
- catalog subject "Optical materials.".
- catalog subject "QC1 .S797 vol. 199 QC482.S3".
- catalog subject "Self-organizing systems.".
- catalog subject "Semiconductors Surfaces.".
- catalog subject "X-rays Scattering.".
- catalog tableOfContents "A Brief Introduction to the Topic -- Basic Principles of X-Ray Diffuse Scattering on Mesoscopic Structures -- Experimental Optimization -- A Model System: LPE SiGe/Si(001) Islands -- Dynamical Scattering at Grazing Incidence -- Characterization of Quantum Dots -- Characterization of Interface Roughness -- Appendix.".
- catalog title "X-ray diffuse scattering from self-organized mesoscopic semiconductor structures / Martin Schmidbauer.".
- catalog type "text".