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- catalog abstract ""Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate. While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films."--Jacket.".
- catalog contributor b13154840.
- catalog contributor b13154841.
- catalog created "2003.".
- catalog date "2003".
- catalog date "2003.".
- catalog dateCopyrighted "2003.".
- catalog description ""Thin films play an important role in many technological applications including microelectronic device, magnetic storage media and surface coatings. This book provides a comprehensive coverage of the major issues and topics dealing with stress, defect formation and surface evolution in thin films. Physical phenomena are examined from the continuum down to the sub-microscopic length scales, with the connections between the structure of the material and its behavior described wherever appropriate.".
- catalog description "1. Introduction and Overview -- 2. Film stress and substrate curvature -- 3. Stress in anisotropic and patterned films -- 4. Delamination and fracture -- 5. Film buckling, bulging and peeling -- 6. Dislocation formation in epitaxial systems -- 7. Dislocation interactions and strain relaxation -- 8. Equilibrium and stability of surfaces -- 9. The role of stress in mass transport.".
- catalog description "Includes bibliographical references and index.".
- catalog description "While the book develops a comprehensive scientific basis with which stress, deformation and failure in thin film materials can be characterized, an attempt is also made to link the scientific concepts to a broad range of practical applications through example problems, historical notes, case studies and exercises. Of particular interest to engineers, materials scientists and physicists, this book will be essential reading for senior undergraduate and graduate courses on thin films."--Jacket.".
- catalog extent "p. cm.".
- catalog identifier "0521822815".
- catalog issued "2003".
- catalog issued "2003.".
- catalog language "eng".
- catalog publisher "New York : Cambridge University Press,".
- catalog subject "621.3815/2 21".
- catalog subject "TA418.9.T45 F74 2003".
- catalog subject "Thin films.".
- catalog tableOfContents "1. Introduction and Overview -- 2. Film stress and substrate curvature -- 3. Stress in anisotropic and patterned films -- 4. Delamination and fracture -- 5. Film buckling, bulging and peeling -- 6. Dislocation formation in epitaxial systems -- 7. Dislocation interactions and strain relaxation -- 8. Equilibrium and stability of surfaces -- 9. The role of stress in mass transport.".
- catalog title "Thin film materials : stress, defect formation, and surface evolution / L.B. Freund, S. Suresh.".
- catalog type "text".